2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2017
DOI: 10.1109/radecs.2017.8696104
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Bayesian Modeling of COTS Power MOSFET Ionizing Dose Impact on Circuit Response

A.F. Witulski
1
,
M. Brandon Smith
2
,
Nagabhushan Mahadevan
3
et al.
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Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters

Witulski
1
,
Mahadevan
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Kauppila
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IEEE Trans. Nucl. Sci.
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Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters

Witulski
1
,
Mahadevan
2
,
Kauppila
3
et al. 2019
IEEE Trans. Nucl. Sci.
5
0
1
0
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Bayesian Network Modeling of Transistor-Level Total Ionizing Dose Effects Impact on Circuit Electrical Response in Space Environment

Zhen,
Ying,
Song
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IEEE Trans. Nucl. Sci.
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