1980
DOI: 10.1016/0022-2836(80)90382-4
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Beam damage to organic material is considerably reduced in cryo-electron microscopy

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Cited by 135 publications
(63 citation statements)
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“…Earlier studies that determined critical exposures did so only for high-resolution Fourier components (6 12 Å) (Taylor and Glaeser, 1976;Hayward and Glaeser, 1979;Unwin and Henderson, 1975;Knapek and Dubochet, 1980) and used electron accelerating voltages (e.g. 100 kV) and temperatures (room temperature or À120°C) no longer common for studying unstained specimens.…”
Section: Resultsmentioning
confidence: 99%
“…Earlier studies that determined critical exposures did so only for high-resolution Fourier components (6 12 Å) (Taylor and Glaeser, 1976;Hayward and Glaeser, 1979;Unwin and Henderson, 1975;Knapek and Dubochet, 1980) and used electron accelerating voltages (e.g. 100 kV) and temperatures (room temperature or À120°C) no longer common for studying unstained specimens.…”
Section: Resultsmentioning
confidence: 99%
“…An effective way of decreasing radiation damage is to cool samples to temperatures around 100 K (15)(16)(17)(18)(19)(20), which is routinely done in x-ray crystallography and electron microscopy. At these temperatures, samples can tolerate a significantly higher dose of ionizing radiation, but eventually they show comparable signs of damage as observed at room temperature.…”
mentioning
confidence: 99%
“…This radiation protection is a direct result of dynamically immobilizing the sample through embedment into vitrified ice (Knapek & Dubochet, 1980). By caging the sample in a frozen environment, free radicals generated from inelastic scattering events are unable to diffuse through the sample and cause secondary damage (Knapek & Dubochet, 1980).…”
Section: Benefits Of Low Temperature Imagingmentioning
confidence: 99%