2002
DOI: 10.2138/rmg.2002.50.8
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Beryllium Analyses by Secondary Ion Mass Spectrometry

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Cited by 7 publications
(5 citation statements)
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“…Ions of the sample material are knocked off the surface of the sample by the oxygen ion beam and drawn into a mass spectrometer, which then sorts the ions according to their atomic weight and charge. Once sorted, the ions are counted, and the counts are converted into a quantitative analysis of the sample (for more information, see Hervig, 2002). Figure A-1 shows a SIMS instrument in operation.…”
Section: Introductionmentioning
confidence: 99%
“…Ions of the sample material are knocked off the surface of the sample by the oxygen ion beam and drawn into a mass spectrometer, which then sorts the ions according to their atomic weight and charge. Once sorted, the ions are counted, and the counts are converted into a quantitative analysis of the sample (for more information, see Hervig, 2002). Figure A-1 shows a SIMS instrument in operation.…”
Section: Introductionmentioning
confidence: 99%
“…() found no measurable matrix effects for the analysis of B concentrations or isotopic compositions in ten synthetic glass samples ranging over a factor of 10 5 in B/SiO 2 . Similarly, Hervig () found no significant matrix effects for Be/Si for a wide variety of silicate glasses and minerals with Be/Si concentrations ranging over a factor of 10 5 .…”
Section: Matrix Effects In Sims Analysismentioning
confidence: 96%
“…Secondary ion mass spectrometry (SIMS) (Arizona State University SIMS Facility, Tempe, AZ, USA) was used to characterize the content and isotopic composition of B in the clay minerals. Analytical protocols for measurement of B contents and δ 11 B values have been described elsewhere [49,[66][67][68] and particularly for measurements of clay minerals by [24].…”
Section: Secondary Ion Mass Spectrometrymentioning
confidence: 99%
“…Primary beam currents below 10 nA were used with beam diameters defocused to 40-60 µm. Positive secondary ions were accelerated away from the sample, and energy filtering (−75 V sample offset) was used for measurements of B-content [66]. No energy filtering was used for isotope ratio measurements.…”
Section: Boron Content and Isotope Analysismentioning
confidence: 99%