2021
DOI: 10.1016/j.ijleo.2021.167691
|View full text |Cite
|
Sign up to set email alerts
|

Bias-controlled photocurrent generation process in GaN-based ultraviolet p–i–n photodetectors fabricated with a thick Al2O3 passivation layer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4

Citation Types

0
4
0

Year Published

2022
2022
2025
2025

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 16 publications
(4 citation statements)
references
References 35 publications
0
4
0
Order By: Relevance
“…In recent years, there has been significant progress in the development of GaN-based materials and their UV photodetectors. Among these advancements, PIN-type structures have gained preference due to their ability to effectively enhance device responsivity and quantum efficiency, as well as their capability to operate in photovoltaic mode [6] [7]. The optimal choice for a high-resistance GaN substrate is intrinsic GaN due to its inherent properties.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, there has been significant progress in the development of GaN-based materials and their UV photodetectors. Among these advancements, PIN-type structures have gained preference due to their ability to effectively enhance device responsivity and quantum efficiency, as well as their capability to operate in photovoltaic mode [6] [7]. The optimal choice for a high-resistance GaN substrate is intrinsic GaN due to its inherent properties.…”
Section: Introductionmentioning
confidence: 99%
“…In order to discard the external power supply of traditional UV PDs and reduce the weight of the device, self-powered UV PDs with energy-savings have become a hotbed of current research. Researchers have developed detectors with a p–n/p–i–n junction, , a metal–semiconductor–metal (MSM), , a Schottky diode, , and a PEC cell type, in order to realize the self-driving characteristic. Unlike Schottky and heterojunction detectors, which require complex fabrication processes and high costs, PEC-type detectors have the advantage of being easy to manufacture and inexpensive.…”
Section: Introductionmentioning
confidence: 99%
“…For example, using crystalline MAPbCl 3 as an application, UV photodetectors show several orders of magnitude improvement . Gallium nitride (GaN), as a representative of the third-generation semiconductor, is the preferred candidate material for UV–vis optoelectronic devices because of its wide band gap (3.4 eV), high saturation rate, electron mobility, and thermochemical stability. In addition, perovskite devices composed of nanoporous (NP) GaN as a substrate in conjunction with an upper perovskite layer have many desired properties including, for example, increasing the stability of the perovskite layer in ambient conditions, increasing the device’s light capture of the device, and improving the device’s sensing performance and sensitivity of the device . Lim et al .…”
Section: Introductionmentioning
confidence: 99%