2019
DOI: 10.1063/1.5113113
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Bipolar resistive switching behaviour of WS2 thin films grown by chemical vapour deposition

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Cited by 4 publications
(3 citation statements)
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“…Hence, discussion on the RS layer deposition techniques cannot be ignored [144]. Inorganic binary oxide storage materials are usually fabricated using various deposition techniques such radio frequency (RF) magnetron sputtering [193], thermal oxidation [194], pulsed laser deposition [195], plasma oxidation [196], electron beam evaporation [176], sol-gel method [192], chemical vapour deposition (CVD) [197] and atomic layer deposition (ALD) [198].…”
Section: Inorganic Dielectric Materials For Rrammentioning
confidence: 99%
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“…Hence, discussion on the RS layer deposition techniques cannot be ignored [144]. Inorganic binary oxide storage materials are usually fabricated using various deposition techniques such radio frequency (RF) magnetron sputtering [193], thermal oxidation [194], pulsed laser deposition [195], plasma oxidation [196], electron beam evaporation [176], sol-gel method [192], chemical vapour deposition (CVD) [197] and atomic layer deposition (ALD) [198].…”
Section: Inorganic Dielectric Materials For Rrammentioning
confidence: 99%
“…Transition-metal dichalcogenides (TMDs) are other members of the 2D material family that have shown great promising characteristics for use in RRAM devices [251]. 2D materials like MoTe 2 , MoS 2 , MoSe 2 , WSe 2 , WS 2 have been used as the dielectric layer (active layer) of the RRAM devices sandwiched between the TE and BE to form memories on rigid and flexible substrate [197,231,254,255,[273][274][275][276][277][278][279][280]. The memory effect of MoS 2 was first appeared in the literature in 2012, and it was demonstrated that the bipolar RS of this developed device was due to charge carriers trapping and detrapping characteristics.…”
Section: -Dimensional Dielectric Materials For Rrammentioning
confidence: 99%
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