2018
DOI: 10.1007/s10853-018-3063-0
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Bismuth oxide-based nanocomposite for high-energy electron radiation shielding

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Cited by 30 publications
(12 citation statements)
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“…A Scanning Electron Microscope (SEM) [JSM-6010LV, JEOL] is based on scanning the sample where the electron beam focused over a sample surface to create images. The electron beam interacts with the sample producing various signals that used to obtain information about the cross section topography and composition 16 , 17 .…”
Section: Methodsmentioning
confidence: 99%
“…A Scanning Electron Microscope (SEM) [JSM-6010LV, JEOL] is based on scanning the sample where the electron beam focused over a sample surface to create images. The electron beam interacts with the sample producing various signals that used to obtain information about the cross section topography and composition 16 , 17 .…”
Section: Methodsmentioning
confidence: 99%
“…FTIR spectroscopy is useful to obtain samples molecular "fingerprint" and observe the possible chemical structure change in developed composites. 29 Surface morphology and fillers dispersion of developed nanocomposites was evaluated by Zeiss Ultra plus SEM at different magnitudes. The fabricated composites were cut into small pieces and placed on aluminum stubs using double-sided carbon tapes.…”
Section: Characterizationmentioning
confidence: 99%
“…Unfortunately, lead is highly toxic and a known carcinogen. Due to this reason, bismuth salts and oxides have been proposed as a safer and lighter alternative to lead (14)(15)(16)(17)(18)(19)(20)(21)(22)(23). Bismuth oxide nanoparticles have been used to coat textile surfaces.…”
Section: Introductionmentioning
confidence: 99%