Block-Diagram Based SIMULINK Analysis for the Drop Impact Response of a Mobile Electronic System

Abstract

In this paper, the block diagram based SIMULINK models were developed to evaluate the dynamic response of a portable electronic product with various impact configurations. The visual interfaces of the developed models present results in a way that people can immediately identify the effects of changing system parameters. It was found that time durations of the input profiles play an important role in the dynamic response. The system response can be designed by carefully choosing the impact time. Certain input pulse time results in the response with very low ringing after first or second peaks. IntroductionDynamic performance during drop impact is a great concern to semiconductor and electronic product manufacturers, especially for portable devices such as mobile phones. Recently more attention and effort have been devoted toward upon mechanical modelling of microelectronic packages under drop impact loads [1][2][3][4][5][6][7][8].In this paper, the block diagram based SIMULINK analysis was introduced to determine the dynamic response of the portable electronic systems with various impact configurations. SIMULINK is an interactive, block-diagram-based tool for modelling and analyzing dynamic systems, and it is tightly coupled with MATLAB and supported by blocksets and extensions. Using such a tool, the relationship between input and output can be obtained and visualized easily and quickly with selected system parameters. As an example, a board level predictive dynamic model was established and the SIMULINK models were developed and used in building block diagrams, performing simulations, as well as analyzing results. The visual interface of the developed models present results in a way that one can immediately identify the effects of changing system parameters.In the section which follows, a simplified 2 DOF

A Comprehensive Review of Drop Impact Modeling on Portable Electronic Devices

“…Zhou et al [44][45][46] developed an analytical approach to predict the dynamic reactions of circuit boards subjected to acceleration based on half-sine pulse. It was established that a predominant response mode cannot be achieved with the existing pulse duration in JEDEC test standards.…”