Atomic structures of Ge 25 Sb 15 S 60 and Ge 35 Sb 5 S 60 glasses are investigated in the ␥-irradiated and annealed after ␥-irradiation states by means of high-energy synchrotron x-ray diffraction technique. The first sharp diffraction peak ͑FSDP͒ is detected at around 1.1 Å −1 in the structure factors of both alloys studied. The FSDP position is found to be stable for radiation/annealing treatment of the samples, while the FSDP intensity shows some changes between ␥-irradiated and annealed states. The peaks in the pair distribution functions observed between 2 and 4 Å are related to the Ge-S, Ge-Sb, and Sb-Sb first neighbor correlations and Ge-Ge second neighbor correlations in the edge-shared GeS 4/2 tetrahedra, and S-S and/or Ge-Ge second neighbor correlations in the corner-shared GeS 4/2 tetrahedra. Three mechanisms of the radiation-/annealing-induced changes are discussed in the framework of coordination topological defect formation and bond-free solid angle concepts.