“…Techniques that trade increased circuit delay for reduced leakage current include: conventional transistor sizing, lower Vdd [32,30], stacked gates [25,35,9], longer channels [23], higher threshold voltages [19,34,21,13,1], and thicker T ox ; we collectively refer to these as statically-selected slow transistors (SSSTs). Techniques for dynamic run-time deactivation of fast transistors include body biasing [24,17,18,20,15], sleep transistors [24,29,13,11,16], and sleep vectors [35,9]; we collectively refer to these as dynamically-deactivated fast transistors (DDFTs). SSSTs and DDFTs are complementary approaches: SSSTs reduce leakage on non-critical paths and DDFTs reduce leakage on critical paths.…”