Bootstrap capacitor in FET gate driver plays an important role in the transient performance of the half bridge configured synchronous buck DC-DC converter especially in the top switch. In this paper, a new bootstrap capacitor based GaN-FET driver is proposed. This new GaN-FET driver is tested in a synchronous buck converter for performance verification like dv dt immunity, transient response, and voltage ringing. A comparison study with the existing LM5113 (Texas Instrument)-based driver for GaN-FET and IR2110-based Si-MOSFET driver on a DC-DC converter is carried out to show the performance improvement using the proposed GaN-FET driver. The simulation study is performed on spice-based NI-Multisim 14.1. Finally, the designed GaN-FET driver is tested on a 60-W synchronous buck DC-DC converter in open-loop and closedloop configuration.