2020
DOI: 10.1016/j.nanoen.2020.105240
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Broadband alternating current photovoltaic effect: An application for high-performance sensing and imaging body aches

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Cited by 22 publications
(41 citation statements)
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“…As further evidence of the Au‐dot‐size‐dependent Schottky barrier formation, Kelvin probe force microscopy (KPFM) measurements were conducted to collect nanoscale contact potential difference data ( V CPD ). [ 10,15,16 ] Interestingly, KPFM measurements revealed that the V CPD changed spatially, as shown in Figure 2e. This variation in V CPD was solely attributed to the size‐dependent work function of the Au dots because the electron affinity of bulk p ‐Si does not change spatially.…”
Section: Resultsmentioning
confidence: 94%
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“…As further evidence of the Au‐dot‐size‐dependent Schottky barrier formation, Kelvin probe force microscopy (KPFM) measurements were conducted to collect nanoscale contact potential difference data ( V CPD ). [ 10,15,16 ] Interestingly, KPFM measurements revealed that the V CPD changed spatially, as shown in Figure 2e. This variation in V CPD was solely attributed to the size‐dependent work function of the Au dots because the electron affinity of bulk p ‐Si does not change spatially.…”
Section: Resultsmentioning
confidence: 94%
“…However, the noted spikes, particularly for centrosymmetricmaterial-based junctions, such as Au dot/Si, are new and have recently been revealed. [16,19] In fact, these spikes appear because of a new type of influence called the alternating current photovoltaic (AC-PV) effect, which occurs under periodic light illumination at the junction/interface of the materials. Indeed, rapid splitting and realignment of the quasi-Fermi levels owing to sudden changes in illumination conditions is the main reason for the occurrence of these peaks, which in turn oscillate the electrons (current) back and forth in the external circuit to maintain the potential difference between the two electrodes.…”
Section: Resultsmentioning
confidence: 99%
“…substrates using an optimized large‐area sputtering technique at room temperature (RT), we performed sequential annealing at various temperatures (from 200 to 600 °C) under maintained oxygen environment, which resulted in the transformation of metallic films into a layer of metal oxide (for further details see the Experimental Section). [ 22 ] However, unlike traditional annealing, the samples were covered by a low resistive p‐Si (≈10 −3 Ω cm) wafer, which promotes the formation of densely packed and uniform layer of metal oxides on a wafer scale, resulting in a high‐performing device, as described below. Initially, the crystalline nature of metal oxide (i.e., TiO 2 ) grown at 200 and 600 °C was investigated using cross‐sectional transmission electron microscopy (TEM).…”
Section: Resultsmentioning
confidence: 99%
“…Remarkably, photo-current (I ph = I light − I dark ) at 0 V increases gradually with light intensity, consisting of the fact that photo-generated e-h pairs density has a straight association to the photon absorption (see Figure 2b). [14,15] Additionally, the I ph variation with light intensity is used to estimate the linear dynamic range (LDR), which is one of the figures of the merit of the device. Mathematically, the LDR is express as 20 log[I ph /I dark ], where I dark is the dark currents and found 103 dB, indicating the excellent sensitivity toward the illuminating light.…”
Section: Resultsmentioning
confidence: 99%
“…The observed I dc is owing to typical photovoltaic effect; however, noticed spikes, especially for centrosymmetric materials, like Si, are new and revealed recently only. [15,20] In fact, these spikes appear because of a new kind of influence, named the alternating current photovoltaic effect, which becomes effective with periodic light illumination at the junction/interface of materials. Indeed, rapid splitting and realignment of quasi-Fermi levels with a sudden change in the light illuminating conditions is the key source behind these peaks, which in turn oscillates electrons (current) back and forth in the external circuit to maintain the potential difference between two electrodes.…”
Section: Resultsmentioning
confidence: 99%