Broken metal fingers in silicon wafer solar cells and PV modules

Chaturvedi, Pooja; Hoex, Bram; Walsh, Timothy M.

doi:10.1016/j.solmat.2012.09.013

Cited by 74 publications

(32 citation statements)

References 6 publications

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“…Intrinsic defects consist of grain boundaries and dislocations, which will decrease the photoelectric conversion efficiency. Extrinsic defects consist of microcracks, breaks, and finger interruptions, which will shorten lifetime, reduce efficiency, and make authentication fails of cells [3,4].…”

Section: Introductionmentioning

confidence: 99%

Automatic Finger Interruption Detection in Electroluminescence Images of Multicrystalline Solar Cells

Tseng

Liu

Chou

2015

Mathematical Problems in Engineering

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This study provides an automatic method for detecting finger interruptions in electroluminescence (EL) images of multicrystalline solar cells. The proposed method is a supervised classification method. We obtain regions of interest (ROI) by separating the EL image to several regions. The fingers within each ROI are candidates for defect detection. We horizontally scan each ROI region and extract features from each finger pixel. In the training stage, we record a set of features which are extracted from interrupted fingers and noninterrupted fingers. These features are represented as points in a spectral embedding space produced by spectral clustering method. These points will be classified into two clusters: interrupted fingers and noninterrupted fingers. In the classification stage, we firstly detect the position of fingers in an EL image and obtain features from each finger. The set of features in each finger combined with known features in the training stage will be represented as points in the spectral embedding space and then will be classified to the cluster with nearer cluster centroid of known features. Experimental results show that the proposed method can effectively detect finger interruptions on a set of EL images of various solar cells.

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Section: Introductionmentioning

confidence: 99%

Automatic Finger Interruption Detection in Electroluminescence Images of Multicrystalline Solar Cells

Tseng

Liu

Chou

2015

Mathematical Problems in Engineering

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“…The second type of EL image change is DRs, as shown in Figure 4b. Chaturvedi et al [17] stated that broken MFs cause DRs in EL images due to the electrical disconnection effect that occurs in EL images. Broken MFs obstruct photovoltaic effects by blocking the electric current, eventually influencing the PV module efficiency and decreasing the productive area.…”

Section: Resultsmentioning

confidence: 99%

Comparison of the 60Sn40Pb and 62Sn2Ag36Pb Solders for a PV Ribbon Joint in Photovoltaic Modules Using the Thermal Shock Test

et al. 2017

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Abstract:In this study, the characteristics of a photovoltaic (PV) ribbon (t = 0.25 mm) joint with 60Sn40Pb and 62Sn2Ag36Pb solders were evaluated using thermal shock tests. The thermal shock tests were performed under three conditions: −40-65 • C, −40-85 • C, and −40-105 • C. The results of these tests were analyzed using electroluminescence (EL) and cross-sectional images. Following testing, broken metal fingers (MFs) were confirmed near the solder joint. PV module degradation was attributed to the broken finger ratio (BFR) based on quantitative analysis of the dark rectangular (DR) regions on the EL images. In addition, the activation energy of the broken MFs was calculated from the increasing BFR. Thermal characteristic variations due to the added Ag in the PV ribbon solder joints were evaluated through observation of solder micro-structure changes following thermal shock tests.

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“…Hot spots are relatively frequent in current PV modules and this situation will likely persist as the PV module technology is evolving to thinner wafers, which are prone to developing micro-cracks during the manipulation process such as manufacturing, transportation, and installation [6][7][8].…”

Section: Introductionmentioning

confidence: 99%

Output-Power Enhancement for Hot Spotted Polycrystalline Photovoltaic Solar Cells

Dhimish

Holmes

Mehrdadi

et al. 2018

IEEE Trans. Device Mater. Relib.

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Broken metal fingers in silicon wafer solar cells and PV modules

Cited by 74 publications

References 6 publications

Automatic Finger Interruption Detection in Electroluminescence Images of Multicrystalline Solar Cells

Automatic Finger Interruption Detection in Electroluminescence Images of Multicrystalline Solar Cells

Comparison of the 60Sn40Pb and 62Sn2Ag36Pb Solders for a PV Ribbon Joint in Photovoltaic Modules Using the Thermal Shock Test

Output-Power Enhancement for Hot Spotted Polycrystalline Photovoltaic Solar Cells

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