1984
DOI: 10.1016/0040-6090(84)90365-1
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Buckling instability and adhesion of carbon layers

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Cited by 170 publications
(61 citation statements)
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“…The values for E and ␥ estimated here are successfully in the same order of magnitude reported before. 27,28 This pattern-formation technique could be used in microdevices, as the metal films are detached from substrates and locally formed well-shaped hermetic tunnels between the films and the substrates. When a laser beam scanned over an existed wavy wrinkle, the metal thin films can be constructed to trirouteway and quadrirouteway patterns (see EPAPS Ref.…”
Section: Fig 1 (Color)mentioning
confidence: 99%
“…The values for E and ␥ estimated here are successfully in the same order of magnitude reported before. 27,28 This pattern-formation technique could be used in microdevices, as the metal films are detached from substrates and locally formed well-shaped hermetic tunnels between the films and the substrates. When a laser beam scanned over an existed wavy wrinkle, the metal thin films can be constructed to trirouteway and quadrirouteway patterns (see EPAPS Ref.…”
Section: Fig 1 (Color)mentioning
confidence: 99%
“…In Ref. [18] the buckling instability condition was utilized for quantitative characterization of the adhesion of a carbon ion beam deposited layer on a quartz substrate.…”
Section: E-mail Address: Afedorov@rugnl (Av Fedorov)mentioning
confidence: 99%
“…Phone cord delaminations have been reported in many different thin film systems with the presence of biaxial compressive residual stress [8][9][10][11][12]. Straight-sided buckling-driven delaminations were also observed, especially under the influence of uniaxial external stress [13][14][15][16].…”
Section: Discussionmentioning
confidence: 89%