“…They found that when the thickness of the ferroelectric layer decreases, the E c increases in the case of a metallic top electrode [8][9][10] and the dielectric response collapses [11,12]. These experiments and others, including the scenario related to surface pinning [13], the influence of an internal electric field on the domain nucleation in depleted films [14], and the presence of a non-ferroelectric layer (passive layer or dead layer) at the ferroelectric-electrode interface [4,8,15], were explained well by a number of developed theoretical models. However, these models paid a little attention to the influence of the interface layer on the characteristics of MFIS-FET.…”