Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

Balen, Tiago R.; Calvano, J.V.; Lubaszewski, Marcelo; Renovell, Michel

doi:10.1007/s10836-007-5004-8

Cited by 14 publications

(11 citation statements)

References 4 publications

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“…1 and it requires only 24 simple operations (additions and subtractions). This minimal complexity of the transformation is very attractive and desired in case of tester embedding into the mixed-signal systems with low-cost microcontroller implementation of built-in self-test (BIST) function [1,33]. The spectrum obtained in this way has components whose positions are representing the number of sign changes (sequences) of unity amplitude bipolar square pulses of Walsh functions defined by Hadamard matrix with the respective order N : …”

Section: Idea Of Specification Testingmentioning

confidence: 99%

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Golonek

Machniewski

2017

Circuits Syst Signal Process

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This paper describes an approach for an analog electronic circuit specification quick verification that is based on a simple mathematical model determined during the before-test stage statistical analysis. Generally, the observed performance parameters (e.g., cutoff frequency, phase shift at the assumed frequency point) are calculated from the Walsh-Hadamard transform components of circuit under test step time response. The optimal estimating formulas for relationship between the tested specifications and the selected components of the spectra are defined in the system based on a linear multiple regression procedure supported by genetic programming. The evolutionary computations significantly improve the approximation effectiveness by selecting the most representative points of the sequences domain and by defining the optimal set of linearizing functions. Finally, at the test stage, only a simple step stimulus and time-effective calculations are required to the tested performance parameters (specifications) of analog circuit identification and it predisposes the approach to quick production testing procedure realization or to embedding it in the mixed-signal systems. The automated built-in self-testing procedure using this concept may be easily implemented to low-cost microcontroller equipped with AD converter used for the testing response samples acquiring.

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Section: Idea Of Specification Testingmentioning

confidence: 99%

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Golonek

Machniewski

2017

Circuits Syst Signal Process

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“…In [9,10], the Transient Response Analysis Method (TRAM) is applied for testing the ispPAC10 device, by adopting a test circuit and the principle of redundancy-based test. The circuit for test response evaluation is implemented in another FPAA, incurring in high hardware overhead.…”

Section: Previous Work and Paper Contributionmentioning

confidence: 99%

“…A proposal for testing FPAA interconnections between blocks is presented in [11,12], addressing a particular FPAA device from Anadigm. It should be noted that the test strategy cannot be applied to the device adopted as case study in [9,10]. Consequently, the configuration test for that device remains unsolved.…”

Section: Previous Work and Paper Contributionmentioning

confidence: 99%

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A low-cost configurability test strategy for an embedded analog circuit

Laprovitta

Peretti

Romero

et al. 2012

Microelectronics Journal

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“…The authors apply oscillation-based test (OBT) for testing the configurable blocks of the ispPAC10 device from lattice and propose a test response analyzer configured in the device, evaluating its fault detection ability through fault injection in the capacitors, switches, and input amplifiers. The transient response analysis method (TRAM) is applied for testing an ispPAC10 and another FPAA device from Anadigm in [9,10]. A proposal for testing FPAA interconnections between blocks is presented in [11,12], addressing a particular FPAA device from Anadigm.…”

Section: Introductionmentioning

confidence: 99%

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Laprovitta

Peretti

Romero

2014

Journal of Electrical and Computer Engineering

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This work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliability, safe operation, or fault tolerance characteristics. Our test proposal consists of programming a reduced set of available configurations for the EACC and testing its functionality by measuring only a few key parameters. The processor executes an embedded test routine that sequentially programs selected configurations, sets the test stimulus, acquires data from the internal ADC, and performs required calculations. The test approach is experimentally evaluated using an embedded system-based real application board. Our experimental results show very good repeatability, with very low errors. These results show that the ACT proposed here is useful for testing the functionality of the circuit under test in a real application context by using a simple strategy at a very low cost.

show abstract

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

Cited by 14 publications

References 4 publications

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations

A low-cost configurability test strategy for an embedded analog circuit

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

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