Built-in self-test of global interconnects of field programmable analog arrays

Andrade, A.; Vieira, Gustavo Fioravanti; Balen, Tiago R.; Lubaszewski, Marcelo; Azaïs, Florence; Renovell, Michel

doi:10.1016/j.mejo.2005.06.001

Cited by 13 publications

(5 citation statements)

References 5 publications

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“…A pesar de que el test de circuitos de señal mixta es un campo de investigación activo, un número relativamente bajo de trabajos se han enfocado en el test de ACCs. Entre ellos merecen citarse (Andrade et al, 2005;Tiago R. Balen et al, 2007;Dri et al, 2020;Laprovitta et al, 2014;Lovay et al, 2015). Asimismo, ninguno de ellos ha sido evaluado en el marco del test de filtros pasabandas.…”

Section: Introductionunclassified

Propuesta de test funcional para filtros pasabanda de capacidades conmutadas embebidos en sistemas en chip reconfigurables

Dri

Romero²,

Peretti³

2020

AJEA

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Este trabajo presenta una propuesta de test funcional para filtros de capacidades conmutadas pasabanda implementados sobre hardware configurable analógico de sistemas en chip de señales mixtas, basado en análisis de respuesta transitorio. El esquema propuesto incorpora la generación de estímulos dentro del mismo chip bajo test, reduciendo el instrumental requerido. La validación del esquema de test se realizó mediante simulación del entorno completo de prueba. Los resultados obtenidos son alentadores para la aplicación de la estrategia, habiéndose encontrado mínimas diferencias entre las especificaciones funcionales obtenidas por la estrategia y los valores de diseño

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Section: Introductionunclassified

Propuesta de test funcional para filtros pasabanda de capacidades conmutadas embebidos en sistemas en chip reconfigurables

Dri

Romero²,

Peretti³

2020

AJEA

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“…The transient response analysis method (TRAM) is applied for testing an ispPAC10 and another FPAA device from Anadigm in [9,10]. A proposal for testing FPAA interconnections between blocks is presented in [11,12], addressing a particular FPAA device from Anadigm. Finally, an application-oriented test strategy is presented in [13], but it requires the application of neural networks with high computational demands.…”

Section: Introductionmentioning

confidence: 99%

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Laprovitta

Peretti

Romero

2014

Journal of Electrical and Computer Engineering

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This work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliability, safe operation, or fault tolerance characteristics. Our test proposal consists of programming a reduced set of available configurations for the EACC and testing its functionality by measuring only a few key parameters. The processor executes an embedded test routine that sequentially programs selected configurations, sets the test stimulus, acquires data from the internal ADC, and performs required calculations. The test approach is experimentally evaluated using an embedded system-based real application board. Our experimental results show very good repeatability, with very low errors. These results show that the ACT proposed here is useful for testing the functionality of the circuit under test in a real application context by using a simple strategy at a very low cost.

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“…The majority of them focus on testing circuits that are implemented on programmable devices, rather than systematically testing all the resources on the given reconfigurable platforms. The study presented in [23] attempts to address the problem of systematically testing programmable resources on an FPAA device. However, its focus is limited to interconnect networks.…”

Section: Introductionmentioning

confidence: 99%