Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs

Kwak, SangKeun; Jo, Jeong-Min; Noh, SeokSoon; Lee, HyeSook; Nah, Wansoo; Kim, Soyoung

doi:10.1109/apemc.2012.6237908

Cited by 5 publications

(5 citation statements)

References 7 publications

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“…The oscilloscope monitors the voltage fluctuation where the wire is connected to the PCB. The forward power is measured from the RF generator when the VDDN fluctuates to less than 1.1 V. This power measured from the RF power source, which we call the traditional forward power, was used as the immunity indicator in previous research [5,6]. The same tests are constructed for two cases of the I/O buffer: one is without any decoupling capacitors (VDDNA), and the other is with decoupling capacitors (VDDNB).…”

Section: Measurement Resultsmentioning

confidence: 99%

“…(2) where r w is the radius of the cable, and h is the distance between the cable and the inner plane of the probe. Using this frequency, the capacitance of the BCI probe can be determined from (5). Additionally, at the anti- resonance frequency, the input impedance Z 11 (ω o ) becomes R o , so the resistance of the BCI probe is also obtained.…”

Section: Equivalent Circuit Modeling For Simulationmentioning

confidence: 99%

“…BCI test modeling and simulation on I/O buffer circuits of low power mobile ICs were conducted in [5]. Forward power, which is the output power level of the RF noise generation source when the IC malfunctions, has been used as an indicator of circuit immunity in previous research [5,6].…”

Section: Introductionmentioning

confidence: 99%

“…Forward power, which is the output power level of the RF noise generation source when the IC malfunctions, has been used as an indicator of circuit immunity in previous research [5,6]. However, the actual power injected to the IC depends on the frequency of injected EM noise and the transfer characteristics of the measurement equipment, the PCB, the package, and the IC impedance.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method

Kim¹,

Nah²,

Kim³

2014

JSTS:Journal of Semiconductor Technology and Science

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Abstract-The bulk current injection (BCI) and direct power injection (DPI) method have been established as the standards for the electromagnetic susceptibility (EMS) test. Because the BCI test uses a probe to inject magnetically coupled electromagnetic (EM) noise, there is a significant difference between the power supplied by the radio frequency (RF) generator and that transferred to the integrated circuit (IC). Thus, the immunity estimated by the forward power cannot show the susceptibility of the IC itself. This paper derives the real injected power at the failure point of the IC using the power transfer efficiency of the BCI method. We propose and mathematically derive the power transfer efficiency based on equivalent circuit models representing the BCI test setup. The BCI test is performed on I/O buffers with and without decoupling capacitors, and their immunities are evaluated based on the traditional forward power and the real injected power proposed in this work. The real injected power shows the actual noise power level that the IC can tolerate. Using the real injected power as an indicator for the EMS test, we show that the on-chip decoupling capacitor enhances the EM noise immunity.

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Section: Measurement Resultsmentioning

confidence: 99%

Section: Equivalent Circuit Modeling For Simulationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method

Kim¹,

Nah²,

Kim³

2014

JSTS:Journal of Semiconductor Technology and Science

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“…Several modelling methods were proposed for system-level setups, e.g. [4][5][6][7][8][9][10][11][12][13], including equivalent circuit modelling e.g. [11,12], 3D MoM or FEM simulations [13] and even measurement-based S-parameter-macromodeling [8,9], possibly indirectly involving VectFit methods [14][15][16].…”

Section: Introductionmentioning

confidence: 99%

Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz

Miropolsky

Jahn

Klotz

et al. 2015

2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication [3] is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.

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EMC/EMI verification methodology for semi-custom design

Huynh

Kim

Nah

et al. 2013

2013 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

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Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs

Cited by 5 publications

References 7 publications

Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method

Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method

Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz

EMC/EMI verification methodology for semi-custom design

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