Calculation of playback signals from MFM images using transfer functions

Vellekoop, S.J.L.; Abelmann, Léon; Porthun, S.; Lodder, J.C.; Miles, J.J.

doi:10.1016/s0304-8853(98)00524-1

Cited by 6 publications

(4 citation statements)

References 4 publications

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“…Single-domain superparamagnetic magnetite particles have not been studied before with this technique. Previous studies on MFM were focused mainly on magnetic recording media (5) and multidomain magnetic materials (6,7) as well as on tip characterization (8) and image interpretation (9,10). Closer to our work, there were reported the imaging and remagnetization of Co magnetic dots (with lateral dimensions of 140 × 250 nm) (11) and imaging and magnetic moment estimation of magnetotactic bacteria (50 nm in length and 17.5 nm in radius, if modeled as a cylinder) (12).…”

Section: Introductionmentioning

confidence: 81%

“…In this case, m p is hardly influenced by the anisotropy field and only thermal fluctuations can be taken into account. Thus, we can replace the magnetization M d of the particle in the Oz direction with the mean magnetization M(H ), calculated using the Boltzmann distribution of magnetic dipolar energies of the particle in the external field of the tip (H ), [10] where L(ξ ) = coth ξ − 1/ξ is the well-known Langevin function and ξ = µ 0 m p H/(k B T ) the Langevin parameter. In order to calculate the field of the tip (Fig.…”

Section: Fig 16mentioning

confidence: 99%

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Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Raşa

Kuipers

Philipse

2002

Journal of Colloid and Interface Science

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Atomic force microscopy (AFM) is used to study the size, shape, and polydispersity of a variety of magnetic and nonmagnetic model colloids, previously imaged by transmission electron microscopy (TEM) only. Both height and phase images are analyzed and special attention is given to 3D morphology and softness of particles, as well as structures and presence of secondary components in the colloid, difficult to investigate with TEM. Several methods of tip characterization followed by deconvolution were applied in order to improve the accuracy of lateral diameter determination. In the case of magnetite particles dispersed in conventional ferrofluids, we explore both experimentally and theoretically the possibility of using magnetic force microscopy (MFM). We propose and discuss several models which allow to estimate the magnetic moment of a single domain superparamagnetic sphere using MFM, which cannot be done with other techniques; alternatively the tip magnetization can be determined. C 2002 Elsevier Science (USA)

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Section: Introductionmentioning

confidence: 81%

Section: Fig 16mentioning

confidence: 99%

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Raşa

Kuipers

Philipse

2002

Journal of Colloid and Interface Science

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“…Scanning Probe Microscopy (SPM) is a generic term that defines a collection of scanning microscopy techniques all based on an atomic force microscope. There is a huge variety of possible microscopy scanning modes, but for multiferroic testing Magnetic Force Microscopy (MFM) [ 66 ], Piezo Force Microscopy (PFM) [ 67 ] and Electric Force Microscopy (EFM) [ 68 ] are the most useful techniques. Both MFM and EFM are non-contact scanning modes, while PFM is a contact measurement mode.…”

Section: Measurement Of Magneto-electric Coupling Via Scanning Promentioning

confidence: 99%

Measurement Techniques of the Magneto-Electric Coupling in Multiferroics

et al. 2017

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The current surge of interest in multiferroic materials demands specialized measurement techniques to support multiferroics research. In this review article we detail well-established measurement techniques of the magneto-electric coupling coefficient in multiferroic materials, together with newly proposed ones. This work is intended to serve as a reference document for anyone willing to develop experimental measurement techniques of multiferroic materials.

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“…Mater Sci Semiconduct Processing 96: 122-126. is the alternating magnetic force between the probe and the sample, H z is the amplitude of high frequency magnetic field. By adjusting the driving frequency of piezoelectric element ω c to satisfy, is the resonance frequency of the probe, as a result, the vibration signal of the probe is[17],…”

mentioning

confidence: 99%

Preparation and Magnetic Properties of Fe Doped Zno Thin Films with Dilute Magnetic Semiconductors

Zhang¹,

Liu²,

Yuanhao³

2019

Int J Nanoparticles Nanotech

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Fe doped ZnO solid solution and its semiconductor thin films were prepared by sol-gel method. After aging and quenching, the films were characterized by X-ray diffraction (XRD) and atomic force microscopy (AFM). The elemental proportion was obtained by energy dispersive spectrometer (EDS) and the magnetic properties were measured by magnetic force microscope (MFM). The results show that iron doping can inhibit the growth of zinc oxide particles, and then increase the roughness of thin films. The results of MFM show that Fe doping can make non-magnetic ZnO semiconductors become dilute magnetic semiconductors. With the increasing amount of Fe doping, the distribution of magnetic domains and magnetic moments becomes more obvious.

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Calculation of playback signals from MFM images using transfer functions

Cited by 6 publications

References 4 publications

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Atomic Force Microscopy and Magnetic Force Microscopy Study of Model Colloids

Measurement Techniques of the Magneto-Electric Coupling in Multiferroics

Preparation and Magnetic Properties of Fe Doped Zno Thin Films with Dilute Magnetic Semiconductors

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