Calibration and standards beamline 6.3.2 at the Advanced Light Source

Underwood, J. H.; Gullikson, Eric M.; Koike, Masato; Batson, Phillip J.; Denham, Paul; Franck, K.; Tackaberry, Ron E.; Steele, W.F.

doi:10.1063/1.1147338

Cited by 80 publications

(43 citation statements)

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“…The XRMS measurements were performed using the reflectometer at the soft x-ray metrology bending magnet beamline 6.3.2 at the Advanced Light Source (ALS) in Berkeley, USA [27,28]. The out-of-plane elliptically polarized radiation was extracted by using a four-jaw aperture in the beamline.…”

Section: Methodsmentioning

confidence: 99%

Induced magnetism at the interfaces of a Fe/V superlattice investigated by resonant magnetic x-ray scattering

Magnuson

2017

Journal of Magnetism and Magnetic Materials

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The induced magnetic moments in the V 3d electronic states of interface atomic layers in a Fe(6ML)/V(7ML) superlattice was investigated by x-ray resonant magnetic scattering. The first V atomic layer next to Fe was found to be strongly antiferromagnetically polarized relatively to Fe and the magnetic moments of the next few atomic layers in the interior V region decay exponentially with increasing distance from the interface, while the magnetic moments of the Fe atomic layers largely remain bulk-like. The induced V moments decay more rapidly as observed by x-ray magnetic scattering than in standard x-ray magnetic circular dichroism. The theoretical description of the induced magnetic atomic layer profile in V was found to strongly rely on the interface roughness within the superlattice period. These results provide new insight into interface magnetism by taking advantage of the enhanced depth sensitivity to the magnetic profile over a certain resonant energy bandwidth in the vicinity of the Bragg angles.

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Section: Methodsmentioning

confidence: 99%

Induced magnetism at the interfaces of a Fe/V superlattice investigated by resonant magnetic x-ray scattering

Magnuson

2017

Journal of Magnetism and Magnetic Materials

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“…The efficiency of the grating was measured at ALS beamline 6.3.2 [21,22] to be 33%for the optimized third order diffraction. The grating profile and the results of the diffraction measurements are presented in Fig.…”

Section: New Methods For Fabrication Of Ultra-high Resolution Gratingsmentioning

confidence: 99%

Ultra-high Resolution Optics for EUV and Soft X-ray Inelastic Scattering

Voronov¹,

Cambie²,

Ahn³

et al. 2010

AIP Conference Proceedings

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Abstract. We describe a revolutionary new approach to high spectral resolution soft x-ray optics. Conventionally in the soft x-ray energy range, high spectral resolution is obtained by use of a relatively low line density grating operated in 1 st order with small slits. This severely limits throughput. This limitation can be removed by use of a grating either in very high order, or with very high line density, if one can maintain high diffraction efficiency. We have developed a new technology for achieving both of these goals which should allow high throughput spectroscopy, at resolving powers of up to 10 6 at 1 keV. Such optics should provide a revolutionary advance for high resolution lifetime free spectroscopy, such as RIXS, and for pulse compression of chirped beams. We report recent developmental fabrication and characterization of a prototype grating optimized for 14.2 nm EUV light. The prototype grating with a 200 nm period of the blazed grating substrate coated with 20 Mo/Si bilayers with a period of 7.1 nm demonstrates good dispersion in the third order (effective groove density of 15,000 lines per mm) with a diffraction efficiency of more than 33%.

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“…(2) The friction tester will be installed and operated in the vacuum measurement chamber of BL-6.3.2 28 at the Advanced Light Source (ALS) under a vacuum of 10 -7 Torr. (3) The rotation speed, loading pressure, and temperature of the rotating ring can be well controlled in the vacuum chamber.…”

Section: Design Of the Friction Testermentioning

confidence: 99%