Cantilever Tilt Causing Amplitude Related Convolution in Dynamic Mode Atomic Force Microscopy

Wang, Chunmei; Sun, Jian; Itoh, Hiroshi; Shen, Dianhong; Hu, J.

doi:10.2116/analsci.27.143

Cited by 4 publications

(3 citation statements)

References 18 publications

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“…A well-defined two-dimensional (2D) probe characterizer made from SiO 2 /Si superlattices [15][16][17] with highly perpendicular side walls [Fig. 1(a)] was used.…”

Section: Experimental Methodsmentioning

confidence: 99%

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Evaluation of Errors in the Measurement of Surface Roughness at High Spatial Frequency by Atomic Force Microscopy on a Thin Film

Wang

Itoh

2012

Jpn. J. Appl. Phys.

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Textured BSCCO superconductors are studied and the various mechanisms for alignment of BSCCO grains addressed. To date, surface energy effects leading to texture development of BSCCO superconductors have been considered only with respect to the free surface of melt-processed Bi-2212 thick films. However, these previous efforts have not included the surface interactions between BSCCO crystals and other solid surfaces present in the BSCCO system. In the present work, a model based on an interfacial energy relation is proposed. In order to verify the model a variety of experiments have been performed. The observation of the microstructure in different BSCCO samples corroborates this model. The following discussion offers a plausible explanation for the various observed phenomena during the partial melt process. During the early stages of solidification, when the peritectic liquid is abundant, BSCCO crystals are rather mobile, facilitating their contact and interaction. As a result, if a crystal has its wide planar c-surface in contact with a foreign surface (e.g. silver substrate, secondary phases, free surface or another BSCCO crystal), it can minimize its surface energy and is likely adhere to that surface. This mechanism, applied to a system with planar constraints, such as a 2212-Ag film, will result in a textured sample, depending on the thickness of the superconducting layer. In a bulk sample however, BSCCO crystals may only minimize their surface energy by adhering to other BSCCO crystals, which will consequently form clusters of locally aligned crystals, i.e. colonies, with no long-range texture. In this fashion, we may also address the role of silver in promoting texture development in BSCCO superconductors.

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“…A well-defined two-dimensional (2D) probe characterizer made from SiO 2 /Si superlattices [15][16][17] with highly perpendicular side walls [Fig. 1(a)] was used.…”

Section: Experimental Methodsmentioning

confidence: 99%

“…The probe radii were precisely characterized by a newly developed probe characterizer made from SiO 2 /Si superlattices. [15][16][17] A geometrical model was established to describe the roughness-probe radius relationship, which was compared with the experimental results obtained under optimized imaging conditions.…”

Section: Introductionmentioning

confidence: 99%

Evaluation of Errors in the Measurement of Surface Roughness at High Spatial Frequency by Atomic Force Microscopy on a Thin Film

Wang

Itoh

2012

Jpn. J. Appl. Phys.

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“…Consequences of this inclined AFM cantilever mount have been identified before, in particular for atomic force microscopy performed in static ("contact") mode where an effective spring constant [6][7][8] has been introduced and a torque [9,10] as well as load [11] correction has been applied. Additionally, a tilted cantilever has been found to lead to a modification of the tip-sample convolution [12], to enhance the sensitivity of the measurement to the probe side [13], and to influence results of multifrequency AFM and Kelvin probe force microscopy [14]. In the presence of a viscous damping layer, in-plane dissipation mechanisms have been found to cause systematic changes of the phase shift in amplitude-modulation AFM depending on the cantilever inclination [15].…”

Section: Introductionmentioning

confidence: 99%

Quantitative dynamic force microscopy with inclined tip oscillation

Rahe¹,

Heile²,

Olbrich³

et al. 2022

Beilstein J. Nanotechnol.

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In the mathematical description of dynamic atomic force microscopy (AFM), the relation between the tip–surface normal interaction force, the measurement observables, and the probe excitation parameters is defined by an average of the normal force along the sampling path over the oscillation cycle. Usually, it is tacitly assumed that tip oscillation and force data recording follows the same path perpendicular to the surface. Experimentally, however, the sampling path representing the tip oscillating trajectory is often inclined with respect to the surface normal and the data recording path. Here, we extend the mathematical description of dynamic AFM to include the case of an inclined sampling path. We find that the inclination of the tip movement can have critical consequences for data interpretation, especially for measurements on nanostructured surfaces exhibiting significant lateral force components. Inclination effects are illustrated by simulation results that resemble the representative experimental conditions of measuring a heterogeneous atomic surface. We propose to measure the AFM observables along a path parallel to the oscillation direction in order to reliably recover the force along this direction.

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