“…The structure and chemical composition of the graphene derivatives were confirmed by scanning electron microscopy-energy dispersive X-ray (SEM-EDX) (Hitachi S 2600N SEM, Hitachi Scientific Instruments, Tokyo, Japan) equipped with a microanalysis detector for EDX (Inca x-act, Oxford Analytical Instruments, Abington, UK), low voltage transmission electron microscopy (LVTEM) (Delong LVEM, Soquelec, Montreal, QC, Canada), fourier transform infrared (FTIR) spectroscopy (Bruker Tensor 27 FTIR spectrophotometer), Raman spectroscopy (LabRAM HR 800, Horiba/Jobin-Yvon, Longjumeau, France) equipped with an Ar-ion 514.5 nm laser operating at 200 mW, as described previously. 10 Further structural characterization was performed using atomic force microscopy (AFM) (Dimension 3100 with a NanoScope IV controller, Veeco Digital Instruments, Santa Barbara, CA) using tapping mode with a silicon cantilever (MPP-11100, spring constant ∼40 N/m, resonance frequency ∼300 kHz, NanoDevices, CA) at scan rates of 0.5 Hz with 512×512 pixels. ζ-potential of graphene derivatives (400 μg/ mL) in water and SF-900 II medium (Gibco BRL, Canadian Life Technologies, Burlington, ON, Canada) were determined using a Zetasizer Nano-ZS (Malvern Instruments, Malvern, UK) in triplicate.…”