2011 12th European Conference on Radiation and Its Effects on Components and Systems 2011
DOI: 10.1109/radecs.2011.6131430
|View full text |Cite
|
Sign up to set email alerts
|

CARMEN2/MEX: An in-flight laboratory for the observation of radiation effects on electronic devices

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
6
0

Year Published

2011
2011
2021
2021

Publication Types

Select...
4
4

Relationship

3
5

Authors

Journals

citations
Cited by 17 publications
(6 citation statements)
references
References 11 publications
0
6
0
Order By: Relevance
“…It was launched on June 10, 2011. One of the payloads is the ICARE-NG [10] instrument which was built in the frame of the CARMEN-1 ("CARactérisation et Modélisation de l'ENvironnement") suite (composed of ICARE-NG and SODAD instruments which have been funded by CNES). The ICARE-NG instrument on-board SAC-D began its operation in August 30, 2011 and stopped in June 7 th 2015.…”
Section: A Total Displacement Damage Dose (Ddd) At 660 Km Altitudementioning
confidence: 99%
“…It was launched on June 10, 2011. One of the payloads is the ICARE-NG [10] instrument which was built in the frame of the CARMEN-1 ("CARactérisation et Modélisation de l'ENvironnement") suite (composed of ICARE-NG and SODAD instruments which have been funded by CNES). The ICARE-NG instrument on-board SAC-D began its operation in August 30, 2011 and stopped in June 7 th 2015.…”
Section: A Total Displacement Damage Dose (Ddd) At 660 Km Altitudementioning
confidence: 99%
“…[4] Because of an important number of SEL observed during ion test, SEU data are not workable. [6] In addition, no proton ground tests were performed and no more components are available.…”
Section: ) Hitachi Hm628512c Ground Testmentioning
confidence: 99%
“…All components are placed inside the ICARE-NG/CARMEN-2 equipment aboard JASON-2 (more precisely on the MEX board), a dedicated instrument to study space radiation and its effects on electronic components developed by EREMS [9]- [10]. Components were intentionally chosen for their high sensitivity to different types of SEE [3]- [4]. Here, we present detailed SEU rate results for the Samsung K7A801800 SSRAM and the IDT IDT71V3558 SSRAM and SEL rate results for the Hitachi HM628512 SRAM.…”
Section: A Component Datamentioning
confidence: 99%
“…Then, the OMERE software combined the sector analysis file together with component radiation test data and the mission's radiation environment to estimate Single Event Rates (SER). These rates are compared to inflight measured rates[3]-[4] during the period between June 2008 and August 2011.…”
mentioning
confidence: 99%