The characteristic temperatures of the threshold current density, T 0 , and external differential quantum efficiency, T 1 , of a series of (Ga,In)(N,As)/GaAs quantum well (QW) laser diodes are measured in the wavelength range from 1 to 1.5 µm. It is found that both T 0 and T 1 strongly decrease with increasing lasing wavelength. The origin of this degradation is shown to be, in the case of T 0 , mostly dominated by a decrease in the transparency current density characteristic temperature, an increase in the optical losses and a decrease in the modal gain. The degradation of T 1 is mainly due to the increase in the optical losses. The effective carrier recombination lifetime in the QW is shown to decrease from 1.2 to 0.2 ns with N content up to 2%, in good agreement with previous reports that link this low lifetime to non-radiative monomolecular recombination through defects in the QW. Carrier leakage is ruled out as the dominant process degrading T 0 and T 1 on the basis of the temperature dependence of the effective carrier recombination lifetime.