2004
DOI: 10.1016/j.anucene.2003.12.001
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Cell homogenization methods for pin-by-pin core calculations tested in slab geometry

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Cited by 18 publications
(5 citation statements)
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“…To overcome this problem, an assumption that DF SPH is constant throughout the assembly surface is introduced in the improved SPH method. Then the discontinuity factor is defined for each cell and can be incorporated by dividing all (SPH-corrected) cross-sections in the assembly [9]. Thus the inverse of DF SPH can be regarded as an additional SPH factor in the simultaneously SPH-corrected P N equation.…”
Section: Resultsmentioning
confidence: 99%
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“…To overcome this problem, an assumption that DF SPH is constant throughout the assembly surface is introduced in the improved SPH method. Then the discontinuity factor is defined for each cell and can be incorporated by dividing all (SPH-corrected) cross-sections in the assembly [9]. Thus the inverse of DF SPH can be regarded as an additional SPH factor in the simultaneously SPH-corrected P N equation.…”
Section: Resultsmentioning
confidence: 99%
“…Number of energy group is one and uniform fixed source over the configuration, whose intensity is 1.0 (1/cm 3 /s), is assumed. This assumption captures the situation in thermal energy groups of light water reactor assembly calculation [9]. Cross-sections used in these calculations are shown in Table 1.…”
Section: Calculation Configurations and Conditionsmentioning
confidence: 99%
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“…6) The calculation results revealed that homogenization error (error in pin-by-pin absorption rate) of the SPH method were larger than that of GET, especially at interface region between different assembly types.…”
Section: Introductionmentioning
confidence: 88%
“…Some of the authors compared cell-homogenization capability of the SPH and GET methods in the simplified pin-bypin geometry that simulates PWR colorset configurations. 6) The calculation results revealed that homogenization error (error in pin-by-pin absorption rate) of the SPH method were larger than that of GET, especially at interface region between different assembly types.…”
Section: Introductionmentioning
confidence: 88%