1981
DOI: 10.1016/s0080-8784(08)62766-0
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Chapter 6 Photovoltaic Infrared Detectors

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Cited by 82 publications
(63 citation statements)
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“…In the following, when we refer to Auger recombination, it is to be understood that we are referring to the Auger 1 mechanism. 11 The amount of recombination that occurs radiatively, as a fraction of the total (radiative plus nonradiative) recombination, is related to the radiative and net nonradiative lifetimes by (6) where R is a recombination rate, τ is a lifetime; and N D is the donor concentration. Subscript Rad indicates radiative; Tot indicates total, which is the sum of radiative and nonradiative processes; and NR indicates nonradiative.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…In the following, when we refer to Auger recombination, it is to be understood that we are referring to the Auger 1 mechanism. 11 The amount of recombination that occurs radiatively, as a fraction of the total (radiative plus nonradiative) recombination, is related to the radiative and net nonradiative lifetimes by (6) where R is a recombination rate, τ is a lifetime; and N D is the donor concentration. Subscript Rad indicates radiative; Tot indicates total, which is the sum of radiative and nonradiative processes; and NR indicates nonradiative.…”
Section: Discussionmentioning
confidence: 99%
“…Equations 2 and 3 follow the notation and variable definitions of Reine et al 11 The radiative Spectral Crosstalk by Radiative Recombination in Sequential-Mode, Dual Mid-Wavelength Infrared Band HgCdTe Detectors 521 coefficient, B, depends on the temperature and local composition, while the SRH trap energy was taken to be at the local, intrinsic Fermi level. The optical absorption coefficient was calculated using the composition-and temperature-dependent expressions of Hougen.…”
Section: Device Modelingmentioning
confidence: 99%
“…The R 0 A increases when the temperature is lowered, with at first a variation law roughly proportional to exp(E g /kT) where E g is the energy gap of the GaInAsSb absorbing layer (0.58 eV). This indicates that the dark current is diffusion controlled at relatively high temperatures [16]. At low temperatures, the R 0 A product slowly changes with T, suggesting the dark current is then controlled by tunneling mechanisms or surface leakage [16].…”
Section: Methodsmentioning
confidence: 99%
“…This indicates that the dark current is diffusion controlled at relatively high temperatures [16]. At low temperatures, the R 0 A product slowly changes with T, suggesting the dark current is then controlled by tunneling mechanisms or surface leakage [16].…”
Section: Methodsmentioning
confidence: 99%
“…The high-frequency dielectric constant is also composition-dependent (Reine et al, 1981) and is given by…”
Section: S Distribution Statement (Of This Report)mentioning
confidence: 99%