Chapter 7 Novel Aberration Correction Concepts

Kabius, B.; Rose, H.

doi:10.1016/s1076-5670(08)01007-0

Cited by 11 publications

(5 citation statements)

References 24 publications

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“…TEM has become a workhorse technique for the characterization of the structural properties of small metal nanoparticles and clusters. , With the advent of aberration corrected instruments, it is now possible to image features such as single metal atoms on crystalline supports in catalysts, − the atomic constituents of larger catalytic nanoparticles, , and grain boundaries in nanotwinned metals , with unprecedented spatial resolution. Despite these impressive capabilities, TEM analysis of complex specimens can still be challenging and time-consuming due to a lack of sample homogeneity.…”

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confidence: 99%

Monodisperse Au₁₁ Clusters Prepared by Soft Landing of Mass Selected Ions

et al. 2011

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Preparation of clean monodisperse samples of clusters and nanoparticles for characterization using cutting-edge analytical techniques is essential to understanding their size-dependent properties. Herein, we report a general method for the preparation of high surface coverage samples of monodisperse clusters containing an exact number of atoms. Polydisperse solutions of diphosphine-capped gold clusters were produced by reduction synthesis. Electrospray ionization was used to introduce the clusters into the gas phase where they were filtered by mass-to-charge ratio allowing clusters of a selected size to be deposited onto carbon coated copper grids at well controlled kinetic energies. Scanning transmission electron microscopy (STEM) analysis of the soft landed clusters confirms their monodispersity and high coverage on the substrate. The soft landing approach may be extended to other materials compatible with an array of available ionization techniques and, therefore, has widespread utility as a means for controlled preparation of monodisperse samples of nanoparticles and clusters for analysis by transmission electron microscopy (TEM).

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confidence: 99%

Monodisperse Au₁₁ Clusters Prepared by Soft Landing of Mass Selected Ions

et al. 2011

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“…On the other hand, an objective polepiece with a 10 mm gap results in about eight times the volume available for in-situ instrumentation (depending on the area in the xy-plane usable for a certain experiments) and contrast transfer calculations for this lens in combination with a C c -corrector show that a spatial resolution of better than 0.07 nm can be expected (Figure 5). 47 An alternative approach to C c correction is the combination of spherical aberration correction with a monochromator. This concept allows similar resolution at the cost of a strongly deformed beam.…”

Section: Future Development Needsmentioning

confidence: 99%

Current status and future directions for in situ transmission electron microscopy

et al. 2016

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This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.

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“…Over the past few decades, there have been numerous advances in instrumentation for the TEM. Advances have been made in spherical 23,24,[40][41][42] and chromatic 43 aberration correctors, monochromators, 23,24,[41][42][43][44] electron sources, 45,46 electron lenses, 47 sample holders, 48 and microlithography processed-samples that incorporate the sample, stimulate it, and measure its macroscopic response in situ, [49][50][51] as well as detectors and image processing software. 52 These developments have not just advanced the spatial resolution such that it is now below 0.7 Â 10 À10 m and element sensitive but have transformed the electron microscope from a static 2D tool to one that is capable of providing time-resolved, 3D structural, compositional, electronic, and magnetic information.…”

Section: A Towards 3d Characterization In Temmentioning

confidence: 99%