Characterisation of the signal and noise transfer of CCD cameras for electron detection

Meyer, Rüdiger R.; Kirkland, Angus I.

doi:10.1002/(sici)1097-0029(20000501)49:3<269::aid-jemt5>3.0.co;2-b

Cited by 116 publications

(61 citation statements)

References 20 publications

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“…The edge of the metal block was used to create a test step function. The orientation of the edge was slightly skewed to the pixel columns, and this geometry allowed the edge to be oversampled without interpolation, using information from many rows of the image (Meyer, et al, 2000, Buhr, et al, 2003.…”

Section: Resolution Of the Ddd Detectormentioning

confidence: 98%

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Applications of direct detection device in transmission electron microscopy

Liang

Milazzo

Kleinfelder

et al. 2008

Journal of Structural Biology

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A prototype Direct Detection Device (DDD) camera system has shown great promise in improving both the spatial resolution and the signal to noise ratio for electron microscopy at 120-400 keV beam energies (Xuong, et al., 2007. Methods in Cell Biology, 79, 721-739). Without the need for a resolution-limiting scintillation screen as in the charge coupled device (CCD), the DDD camera can outperform CCD based systems in terms of spatial resolution, due to its small pixel size (5 μm). In this paper, the modulation transfer function (MTF) of the DDD prototype is measured and compared with the specifications of commercial scientific CCD camera systems. Combining the fast speed of the DDD with image mosaic techniques, fast wide-area imaging is now possible. In this paper, the first large area mosaic image and the first tomography dataset from the DDD camera are presented, along with an image processing algorithm to correct the specimen drift utilizing the fast readout of the DDD system.

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Section: Resolution Of the Ddd Detectormentioning

confidence: 98%

“…The edge spread function (ESF) and eventually the MTF were calculated using the fitted curve. To correct for the finite pixel size effect (Meyer, et al, 2000), the final MTF curve was divided by the sampling function (sinc function) based on the pixel size.…”

Section: Resolution Of the Ddd Detectormentioning

confidence: 99%

Applications of direct detection device in transmission electron microscopy

Liang

Milazzo

Kleinfelder

et al. 2008

Journal of Structural Biology

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show abstract

“…The effect on image SNR is described by the frequency-dependent DQE, 10 which can be derived from the MTF and noise power spectrum ͑NPS͒ of a blank image with no specimen in place as DQE͑D , s͒ = MTF 2 ͑s͒ / ͓NPS͑D , s͒ / D͔, where s is the spatial frequency and D is the exposure in electrons per pixel. 11,14 Figure 4͑a͒ shows line scans across such an edge with net incident energies of 300, 220, 120, and 30 keV. The improvement in sharpness of the edge image with decreasing energy is clear.…”

Section: Experimental Camera Performancementioning

confidence: 99%

“…At 300 kV, the curves correspond well to other published measurements that typically show a DQE near 0.1 at half-Nyquist frequency. 8,11 As the incident energy of the electrons decreases, the DQE improves dramatically, reaching its highest values around 40-50 keV. As the energy decreases below 40 keV, the signal amplitude falls rapidly, resulting in substantially lower DQE.…”

Section: Experimental Camera Performancementioning

confidence: 99%

A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

Downing

Mooney²

2008

Review of Scientific Instruments

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Electron microscopists are increasingly turning to intermediate voltage electron microscopes ͑IVEMs͒ operating at 300-400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device ͑CCD͒ cameras, which have become widely used on electron microscopes. Under some conditions, CCDs provide an improvement in data quality over photographic film, as well as the many advantages of direct digital readout. However, CCD performance is seriously degraded on IVEMs compared to the more conventional 100 kV microscopes. In order to increase the efficiency and quality of data recording on IVEMs, we have developed a CCD camera system in which the electrons are decelerated to below 100 kV before impacting the camera, resulting in greatly improved performance in both signal quality and resolution compared to other CCDs used in electron microscopy. These improvements will allow high-quality image and diffraction data to be collected directly with the CCD, enabling improvements in data collection for applications including high-resolution electron crystallography, single particle reconstruction of protein structures, tomographic studies of cell ultrastructure, and remote microscope operation. This approach will enable us to use even larger format CCD chips that are being developed with smaller pixels.

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“…At 300 kV, the curves correspond well to other published measurements that typically show a DQE near 0.1 at half Nyquist frequency. 8,11 As the incident energy of the electrons decreases, the DQE improves dramatically, reaching its highest values around 40-50 keV. As the energy decreases below 40 keV the signal amplitude falls rapidly, resulting in substantially lower DQE.…”

Section: Experimental Camera Performancementioning

confidence: 99%

CCD Camera with Electron Decelerator for Intermediate Voltage Electron Microscopy

Downing

Mooney²

2004

Microsc Microanal

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Electron microscopists are increasingly turning to Intermediate Voltage Electron Microscopes (IVEMs) operating at 300 -400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device (CCD) cameras, which have become widely used on electron microscopes. Under some conditions CCDs provide an improvement in data quality over photographic film, as well as the many advantages of direct digital readout. However, CCD performance is seriously degraded on IVEMs compared to the more conventional 100 kV microscopes. In order to increase the efficiency and quality of data recording on IVEMs, we have developed a CCD camera system in which the electrons are decelerated to below 100 kV before impacting the camera, resulting in greatly improved performance in both signal quality and resolution compared to other CCDs used in electron microscopy. These improvements will allow high-quality image and diffraction data to be collected directly with the CCD, enabling improvements in data collection for applications including high-resolution electron crystallography, single-particle reconstruction of protein structures, tomographic studies of cell ultrastructure and remote microscope operation. This approach will enable us to use even larger format CCD chips that are being developed with smaller pixels.

show abstract

Characterisation of the signal and noise transfer of CCD cameras for electron detection

Cited by 116 publications

References 20 publications

Applications of direct detection device in transmission electron microscopy

Applications of direct detection device in transmission electron microscopy

A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

CCD Camera with Electron Decelerator for Intermediate Voltage Electron Microscopy

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