2021
DOI: 10.1109/access.2021.3108583
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Characteristics Modeling of GaN Class-AB Dual-Band PA Under Different Temperature and Humidity Conditions

Abstract: As the technology scales down, besides the CAD tools and design guidelines, understanding circuit performance degradation as a consequence of transistor degradation becomes essential for designers. Due to several adverse environmental conditions, the study of performance degradation in the power amplifier (PA) is very demanding research. In this paper, an RF PA is experimentally studied to observe various characteristic degradations in a broad range of operating temperature and humidity conditions. Based on a … Show more

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Cited by 4 publications
(6 citation statements)
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“…However, in the middle band, only the efficiency decreases. These drawbacks can be observed in previous works [3][4][5][6][7][8][9][10][11][12][13][14][15][16] where the output power and power gain are not isolated in the middle band. Isolation within the middle band is crucial for efficiency and linearity.…”
mentioning
confidence: 88%
See 1 more Smart Citation
“…However, in the middle band, only the efficiency decreases. These drawbacks can be observed in previous works [3][4][5][6][7][8][9][10][11][12][13][14][15][16] where the output power and power gain are not isolated in the middle band. Isolation within the middle band is crucial for efficiency and linearity.…”
mentioning
confidence: 88%
“…Multiband systems have gained popularity in recent years due to their compact size, low cost, and ease of implementation. Several dual-band PAs with different structures have been reported [3][4][5][6][7][8][9][10][11][12][13][14][15][16] . Challenges in dual-band PAs include efficiency, output power, gain, and cost, with the most significant challenge being the similarity of characteristics between the two bands.…”
mentioning
confidence: 99%
“…Therefore, it is feasible to use ANN to investigate the temperature behavior of PA. On the basis of this idea, the deep neural network (DNN), BPNN and extreme learning machine (ELM) were chosen for the first time to predict the temperature behavior of a complementary metal oxide semiconductor (CMOS) PA by 236 groups of measurement samples in 2018 20 . Subsequently, the four two‐dimensional interpolation models based on a few key measurement points were applied to analysis the performance difference of a gallium nitride (GaN) class‐AB PA when temperature changed 21 . In 2022, the support vector machine (SVM) was first utilized to model the temperature behavior of a CMOS class‐A PA according to measurement data and the difference in the number of training data was discussed 22 .…”
Section: Introductionmentioning
confidence: 99%
“…Different from other works in References 17, 20–23, a GaAs pHEMT PA is selected as the experiment object, which makes circuit more susceptible to temperature changes due to the low thermal conductivity. It is more urgent to model the temperature behavior of this PA.…”
Section: Introductionmentioning
confidence: 99%
“…Microwave power amplifiers are key devices that utilize AlGaN/GaN high-electron-mobility transistors (HEMTs) [1][2][3][4][5][6][7][8][9][10][11][12][13]. Amplifier distortion becomes critical because wideband and multivalue linear modulation is used to achieve high speed and large capacity in modern wireless communication.…”
Section: Introductionmentioning
confidence: 99%