1998
DOI: 10.1109/16.711369
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Characteristics of MSM photodetectors with trench electrodes on p-type Si wafer

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Cited by 38 publications
(2 citation statements)
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“…[47] Even the crystal photodetector of 1 also shows high responsivity at high irradiation (Figure S7, see Supporting Information), such as at 1 mW cm −2 (R ∼ 3.01 A W −1 ), 10 mW cm −2 (R ∼ 1.05 A W −1 ), which is higher than that of commercial Si PDs (<0.2 A W −1 ). [48,49] Photo-detectivity (D*) is another crucial index to evaluate the ability of photodetector to perceive weak light signals, which can be estimated by D* = I ph /[P 0 S(2qI dark ) 1/2 ], where q is the elementary electronic charge. With the incident light power density decreasing, the D* values of 1 also show a gradual increasing variation and the maximum value reaches to be ≈1.2 × 10 13 Jones, which is much higher than other known 2D hybrid perovskites detectors, such as (4-AMP)Cs 2 Pb 3 Br 10 (D* ∼ 6.5 × 10 10 Jones) [17] and (IA) 2 (DMA)Pb 2 Br 7 (D* ∼ 2.8 × 10 11 Jones).…”
Section: Resultsmentioning
confidence: 99%
“…[47] Even the crystal photodetector of 1 also shows high responsivity at high irradiation (Figure S7, see Supporting Information), such as at 1 mW cm −2 (R ∼ 3.01 A W −1 ), 10 mW cm −2 (R ∼ 1.05 A W −1 ), which is higher than that of commercial Si PDs (<0.2 A W −1 ). [48,49] Photo-detectivity (D*) is another crucial index to evaluate the ability of photodetector to perceive weak light signals, which can be estimated by D* = I ph /[P 0 S(2qI dark ) 1/2 ], where q is the elementary electronic charge. With the incident light power density decreasing, the D* values of 1 also show a gradual increasing variation and the maximum value reaches to be ≈1.2 × 10 13 Jones, which is much higher than other known 2D hybrid perovskites detectors, such as (4-AMP)Cs 2 Pb 3 Br 10 (D* ∼ 6.5 × 10 10 Jones) [17] and (IA) 2 (DMA)Pb 2 Br 7 (D* ∼ 2.8 × 10 11 Jones).…”
Section: Resultsmentioning
confidence: 99%
“…Very recently, Ge-on-SOI MSM photodetector has been experimentally demonstrated to exhibit high dark current performance in the order of 150 µA for a given applied bias of 1.0 V, despite achieving impressive speed performance [4]. In order to circumvent this issue, various approaches have been explored for effective dark current suppression which include the adoption of SiO 2 passivation [5], amorphous-Si [6,7] or amorphous-Ge [8] thin films between the Schottky contact and the semiconductor interface for modulating the Schottky barrier height.…”
Section: Introductionmentioning
confidence: 99%