Characteristics of single-event upsets in a fabric switch (AD8151)

Abstract

Abstract-Two types of single-event effects-bit errors and single-event functional interrupts-were observed during heavy-ion testing of the AD8151 crosspoint switch. Bit errors occurred in bursts with the average number of bits in a burst being dependent on both the ion linear energy transfer (LET) and on the data rate. A pulsed laser was used to identify the locations on the chip where the bit errors and single-event functional interrupts occurred. Bit errors originated in the switches, drivers, and output buffers. Single-event functional interrupts originated in the second-rank latch containing the data specifying the state of each switch in the 33 17 matrix.Index Terms-Bit errors, fabric switch, heavy ions, pulsed laser, single-event functional interrupt.

Single event effects results for candidate spacecraft electronics for NASA

“…In general, the burst length increased with both laser pulse energy and data rate, confirming the trend observed when testing with heavy ions and protons [33], [48]-[51]. Details of the heavy ion and proton radiation test results of the AD8 15 1 are submitted for publication to RADECS03 [52]. …”