2009
DOI: 10.1088/0268-1242/24/3/035015
|View full text |Cite
|
Sign up to set email alerts
|

Characteristics of the ZnO thin film transistor by atomic layer deposition at various temperatures

Abstract: ZnO thin films were deposited by atomic layer deposition (ALD) at various temperatures and the resulting electrical and chemical properties were examined. The fraction of O-H bonds in ZnO films decreased from 0.39 to 0.24 with increasing processing temperatures. The O/Zn ratio decreased from 0.90 at 70 • C to 0.78 at 130 • C. The carrier concentration and resistivity changed sharply with decreasing temperature. The ZnO thin film transistors (TFTs) were fabricated at processing temperatures of 70 to 130 • C and… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

8
72
1

Year Published

2010
2010
2024
2024

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 115 publications
(81 citation statements)
references
References 21 publications
8
72
1
Order By: Relevance
“…The advantage of using remote plasma ZnO ALD compared to water-based oxidation [3]- [5] is the reduction of OH impurities which can increase film resistivity. ZnO nanowires were fabricated using an anisotropic reactive ion CHF 3 etch in an OIPT 80+ system to form nanowires at the sides of the SiO 2 pillars, as shown in Fig.…”
Section: Device Fabricationmentioning
confidence: 99%
See 1 more Smart Citation
“…The advantage of using remote plasma ZnO ALD compared to water-based oxidation [3]- [5] is the reduction of OH impurities which can increase film resistivity. ZnO nanowires were fabricated using an anisotropic reactive ion CHF 3 etch in an OIPT 80+ system to form nanowires at the sides of the SiO 2 pillars, as shown in Fig.…”
Section: Device Fabricationmentioning
confidence: 99%
“…Even though there have been numerous reports on ZnO deposition techniques, recent attention has been focused on conventional atomic layer deposition (ALD) as the preferred growth method due to the low growth temperature and good control of thickness, composition, and uniformity [3]. ZnO thin-film transistors (TFTs) fabricated with thermal and plasma-enhanced ALD have shown excellent electrical characteristics [3], [4].…”
mentioning
confidence: 99%
“…3(b). However, it is still high compared with other ALD ZnO films [6,8]. The carbon content can be further reduced by optimizing the DEZ dose time.…”
Section: Resultsmentioning
confidence: 94%
“…However, these depositions require high temperatures and it is difficult to perform large area deposition on low cost substrates. Recent attention has been focused on conventional ALD as the preferred growth method due to the low growth temperature, good crystallinity and good control of thickness, composition and uniformity [6][7][8][9][10]. ZnO thin film transistors fabricated with ALD ZnO have shown excellent electrical characteristics [6][7][8].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation