1989
DOI: 10.1007/978-1-4757-0770-0_25
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Characterization and Design of Semiconductor Lasers Using Strain

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Cited by 8 publications
(4 citation statements)
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“…It has been shown [16,17] for several 1.5 µm wavelength strained-layer MQW lasers that the Auger component is the main component of the threshold current in long-wavelength lasers and is reduced by the application of hydrostatic pressure. In a loss-free laser, one would generally expect the radiative threshold current to increase with pressure as the bandgap increases [8]. This has indeed been observed for GaAs lasers [8,16] and will be discussed in section 3.3.1.…”
Section: Pressure Dependence Of Threshold Currentmentioning
confidence: 65%
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“…It has been shown [16,17] for several 1.5 µm wavelength strained-layer MQW lasers that the Auger component is the main component of the threshold current in long-wavelength lasers and is reduced by the application of hydrostatic pressure. In a loss-free laser, one would generally expect the radiative threshold current to increase with pressure as the bandgap increases [8]. This has indeed been observed for GaAs lasers [8,16] and will be discussed in section 3.3.1.…”
Section: Pressure Dependence Of Threshold Currentmentioning
confidence: 65%
“…In a loss-free laser, one would generally expect the radiative threshold current to increase with pressure as the bandgap increases [8]. This has indeed been observed for GaAs lasers [8,16] and will be discussed in section 3.3.1. By contrast, all the 1.5 µm devices show a remarkable decrease in threshold current with pressure.…”
Section: Pressure Dependence Of Threshold Currentmentioning
confidence: 65%
See 1 more Smart Citation
“…In a loss-free laser, we would generally expect the radiative threshold current to increase with pressure as the bandgap increases [55]. P-based laser devices show a remarkable decrease in threshold current with pressure.…”
Section: Pressure Dependence Of Threshold Currentmentioning
confidence: 99%