2006
DOI: 10.1016/j.sna.2005.12.048
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Characterization and strain gradient optimization of PECVD poly-SiGe layers for MEMS applications

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Cited by 32 publications
(16 citation statements)
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“…The absolute dielectric constant in vacuum is taken to be ε v = 8.8542 × 10 −12 F m −1 . van der Waals force F v according to Liu et al [29] is assumed to take the form 15) where the Hamaker constant A 12 = 4 × 10 −20 J. The Casimir force according to Liu et al [29] is and substituting (2.11) and (2.12) into equation (2.17), we can obtain the nonlinear governing equations for the microbeam as follows:…”
Section: Basic Equationsmentioning
confidence: 99%
“…The absolute dielectric constant in vacuum is taken to be ε v = 8.8542 × 10 −12 F m −1 . van der Waals force F v according to Liu et al [29] is assumed to take the form 15) where the Hamaker constant A 12 = 4 × 10 −20 J. The Casimir force according to Liu et al [29] is and substituting (2.11) and (2.12) into equation (2.17), we can obtain the nonlinear governing equations for the microbeam as follows:…”
Section: Basic Equationsmentioning
confidence: 99%
“…Especially, Witvrouw and his co-workers [10,11] developed a multilayer poly-SiGe deposition process for fabricating MEMS structural layers that fulfill all material and economical requirements. They find that Ploy-SiGe shows excellent properties in this MEMS applications.…”
Section: Introductionmentioning
confidence: 99%
“…With their associates, they also conducted an experimental study for the characterization and strain gradient optimization of PECVD (plasma enhanced chemical vapor deposition) poly-SiGe layers for MEMS applications [6]. Recently, Jia et al [7,8] studied the pull-in instability and free vibration of electrostatically actuated FGM (functionally graded material) micro-beams allowing for the geometric nonlinearity and intermolecular Casimir force, but without considering the temperature change.…”
Section: Introduction mentioning
confidence: 99%