Characterization of a dye doped planar polymer waveguide by leakage radiation microscopy

Zhang, D G; Fu, Qiang; Wang, X X; Chen, Y K; Wang, P; Ming, Hai

doi:10.1088/2040-8978/14/1/015003

Cited by 7 publications

(10 citation statements)

References 20 publications

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“…Multiple rings can also be observed with thicker dielectric layer. In this case the multiple rings are due to multiple TE or TM modes in the top silica layer [27]. From the FFP and BFP images alone we cannot determine whether the SiO 2 film has a uniform thickness or if the rings are due to additional modes in the structure.…”

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confidence: 99%

Out-of-focal plane imaging by leakage radiation microscopy

Zhu

Zhang

Wang

et al. 2017

J. Opt.

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Leakage radiation microscopy (LRM) is used to investigate the optical properties of surfaces. The front-focal plane (FFP) image with LRM reveals structural features on the surfaces. Back-focal plane (BFP) image with LRM reveals the angular distribution of the radiation. Herein we experimentally demonstrate that the out-of-focal plane (OFP) images present a link between the FFP and BFP images and provide optical information that cannot be resolved by either FFP or BFP images. The OFP image provides a linkage between the spatial location of the emission and the angular distribution from the same location, and thus information about the film’s discontinuity, nonuniformity or variable thickness can be uncovered. The use of OFP imaging will extend the scope and applications of the LRM and coupled emission imaging which are powerful tools in nanophotonics and high throughput fluorescence screening.

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confidence: 99%

Out-of-focal plane imaging by leakage radiation microscopy

Zhu

Zhang

Wang

et al. 2017

J. Opt.

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“…However, the guided mode characterization is always a difficult issue due to the confined nature, though several approaches has been developed in the last decade. [16][17][18] Recently, a powerful technique called leakage radiation microscopy (LRM) was developed to analyze not only the SPPs on pure metal surface [19][20][21] but also the SPPs 22 and guided modes [23][24][25] in dielectric-loaded waveguides.…”

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confidence: 99%

“…Moreover, the interference is a coherent process, so it will not occur in luminescent guided mode in dye-doped PMMA waveguides. 25 On the contrary, the characteristic of TE mode determines the field intensity decays to be very small at the metal/polymer interface [see Fig. 2(b)], which greatly inhibits the LRM detection.…”

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confidence: 99%

Direct observation of guided-mode interference in polymer-loaded plasmonic waveguide

Cheng

Guo

et al. 2012

Applied Physics Letters

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Related Articles Stress evaluation in thin strained-Si film by polarized Raman spectroscopy using localized surface plasmon resonance Appl. Phys. Lett. 101, 172101 (2012) Ultrasmall radial polarizer array based on patterned plasmonic nanoslits Appl. Phys. Lett. 101, 161119 (2012) Localized surface plasmon resonances in highly doped semiconductors nanostructures Appl. Phys. Lett. 101, 161113 (2012) Polarization dependant scattering as a tool to retrieve the buried phase information of surface plasmon polaritons Appl.

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“…This layer results in additional optical modes and additional cones of emission [55–56]. The dielectric thickness determines the presence of different modes and their polarization.…”

Section: Resultsmentioning

confidence: 99%

“…Similar reasoning can be used to interpret the MDW BFP image in Figure 7 (Figure 7, middle right). Addition of a thicker dielectric layer on the top SP structure allows the MDW structure to support two or more optical modes [71–72]. These modes have different field intensity distributions in the structure and radiate through the glass substrate at different angles (Figure 2 bottom), which appear as two rings in the MDW BFP image.…”

Section: Resultsmentioning

confidence: 99%

Radiative decay engineering 8: Coupled emission microscopy for lens-free high-throughput fluorescence detection

Zhu

Badugu

Zhang

et al. 2017

Analytical Biochemistry

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Fluorescence spectroscopy and imaging are now used throughout the biosciences. Fluorescence microscopes, spectrofluorometers, microwell plate readers and microarray imagers all use multiple optical components to collect, redirect and focus the emission onto single point or array imaging detectors. For almost all biological samples, except those with regular nanoscale features, emission occurs in all directions. With the exception of complex microscope objectives with large collection angles (NA ≤ 0.5), all these instruments collect only a small fraction of the total emission. Because of the increasing knowledge base on fluorophores within near-field (< 200 nm) distances from plasmonic and photonic structures we can anticipate the development of compact devices in which the sample to be detected is located directly on solid state detectors such as CCDs or CMOS cameras. Near-field interactions of fluorophores with metallic or dielectric multi-layer structures (MLSs) can capture a large fraction of the total emission. Depending on the composition and dimensions of the MLSs, the spatial distribution of the sample emission results in distinct optical patterns on the detector surface. With either plain glass slides or MLSs the most commonly used front focal plane (FFP) images reveal the x-y spatial distribution of emission from the sample. Another approach, which is often used with two or three-dimensional nanostructures, is back focal plane (BFP) imaging. The BFP images reveal the angular distribution of the emission. The FFP and BFP images occur at certain distances from the sample which is determined by the details of the optical components. Obtaining these images requires multiple optical components and distances which are too large for the compact devices. For devices described in this paper, the images will be detected at a fixed distance between the sample and some arbitrary distance below the MLS which is determined by the geometry and thicknesses of the components. We refer to measurements at these locations as out-of-focal plane (OFP) imaging. Herein we describe a method to measure the optical fields at micron and multi-micron distances below the MLS, which will represent the images seen by an optically coupled array detector. The possibility of sub-surface optical images is illustrated using five different multi-layer structures. This is accomplished using an optical configuration which allows measurement at a front focal plane (FFP), back focal plane (BFP) or any OFP locations. Our OFP imaging method provides a link between the FFP images which reveals the surface distribution of fluorophores with the BFP images that reveal the angular distribution of emission. This linkage can be useful when examining structures which have nanoscale features due to fluorescence or leakage radiation from nanostructures.

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Characterization of a dye doped planar polymer waveguide by leakage radiation microscopy

Cited by 7 publications

References 20 publications

Out-of-focal plane imaging by leakage radiation microscopy

Out-of-focal plane imaging by leakage radiation microscopy

Direct observation of guided-mode interference in polymer-loaded plasmonic waveguide

Radiative decay engineering 8: Coupled emission microscopy for lens-free high-throughput fluorescence detection

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