2018
DOI: 10.1016/j.jallcom.2018.07.295
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Characterization of Al/In:ZnO/p-Si photodiodes for various In doped level to ZnO interfacial layers

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Cited by 76 publications
(24 citation statements)
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“…The photodiode property of the Au/CuCo 2 S 4 /p-Si device is based on the increasing carriers in the interface of the metalsemiconductor junction by light intensity. 19 Normally, CuCo 2 S 4 has a 1.41 eV band gap and can easily absorb the solar spectrum. 13 In this case, the…”
Section: Resultsmentioning
confidence: 99%
“…The photodiode property of the Au/CuCo 2 S 4 /p-Si device is based on the increasing carriers in the interface of the metalsemiconductor junction by light intensity. 19 Normally, CuCo 2 S 4 has a 1.41 eV band gap and can easily absorb the solar spectrum. 13 In this case, the…”
Section: Resultsmentioning
confidence: 99%
“…According to Fig. 8a, the Au/T-CuSbS 2 /p-Si (13) I ph = P m and Au/S-CuSbS 2 /p-Si devices have linear behavior with increasing light intensity and can be performed as photodetector applications [51]. Figure 8b exhibits photoresponse graph of the Au/T-CuSbS 2 /p-Si and Au/S-CuSbS 2 /p-Si devices.…”
Section: Andmentioning
confidence: 97%
“…Yildirim et al. makes a Al/ZnO/p‐Si stratified structure where the ZnO layers are In doped with different concentration . It is noticeable that the surface morphology changes a lot after doping.…”
Section: Lateral Photovoltaic Effectmentioning
confidence: 99%