2009
DOI: 10.1002/adma.200803046
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Characterization of Charge Collection in Photodiodes under Mechanical Strain: Comparison between Organic Bulk Heterojunction and Amorphous Silicon

Abstract: Both gradual electrical changes and device failure mechanisms caused by mechanical strain in organic photodiodes are investigated and compared to a‐Si:H deposited on plastic substrates.

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Cited by 33 publications
(27 citation statements)
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“…Two trends in our data are consistent with conclusions of other studies that applied mechanical stress to a-Si films at room temperature: (1) failure under tension occurs at lower absolute stress levels than under compression, [38][39][40][41][42] and (2) the absolute magnitude of compressive stress possible without failure is on the order of 1 GPa. 39,40,42 …”
Section: E Failure Of Stressed A-si Filmssupporting
confidence: 80%
“…Two trends in our data are consistent with conclusions of other studies that applied mechanical stress to a-Si films at room temperature: (1) failure under tension occurs at lower absolute stress levels than under compression, [38][39][40][41][42] and (2) the absolute magnitude of compressive stress possible without failure is on the order of 1 GPa. 39,40,42 …”
Section: E Failure Of Stressed A-si Filmssupporting
confidence: 80%
“…Actually, more than five samples were measured for each of the D1 and D2 devices to confirm the electrical behavior. This behavior was also observed in ZnO nanowire , graphene (GLs) , organic photosensitive material poly [2‐methoxy‐5‐(2‐ethylhexyloxy)‐1, 4‐phenylene‐vinylene] (MEHPPV) and [6,6]‐phenyl C61‐butyric acid methyl ester (PCBM) blends and organic rubrene crystals . ZnO is a material that simultaneously has semiconducting and piezoelectric properties.…”
Section: Resultsmentioning
confidence: 67%
“…In order to confirm the electrical behavior related with the variation of band structure, the optical absorption spectra of PbI 2 crystal slices assembled on PET substrate were measured (SHIMADZU 2550 UV–Vis spectrophotometers) under flat and bent conditions with a homemade fixture. The value of the bandgap E g = 2.28 eV was determined from αhν = B ( hν − E g ) m , where α is the absorbance, hν is the incident photon energy, B is a constant, and m is a constant taking the value 1/2 when the material is a direct‐bandgap semiconductor . Figure a shows the ( αhν ) 2 versus hν plot of the devices under different tensile strain.…”
Section: Resultsmentioning
confidence: 99%
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“…1 Moreover, OPDs need no color filter system due to narrow absorption spectrum of organic materials and transparent OPDs can be used for compact, lightweight, and high resolution full color image sensors by stacking two or more color selective OPDs vertically. 2 In complementary metalÀoxideÀsemiconductor (CMOS) image sensors, the transparent OPDs which detect one of three primary colors or more can be integrated with silicon photodetectors.…”
mentioning
confidence: 99%