2006
DOI: 10.1109/lpt.2006.879527
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Characterization of CMOS compatible waveguide-coupled leaky-mode photodetectors

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Cited by 14 publications
(3 citation statements)
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“…In addition to a recent report of top-WG-integrated Ge PD, 7 there have been a few previous reports of Si PDs [8][9][10][11] integrated with upper dielectric WGs. However, most of them exhibited slow evanescent wave coupling rates and amorphous 10 or polycrystalline 11 silicon detectors, which also suffered from low quantum efficiency and high bias voltage requirements.…”
mentioning
confidence: 98%
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“…In addition to a recent report of top-WG-integrated Ge PD, 7 there have been a few previous reports of Si PDs [8][9][10][11] integrated with upper dielectric WGs. However, most of them exhibited slow evanescent wave coupling rates and amorphous 10 or polycrystalline 11 silicon detectors, which also suffered from low quantum efficiency and high bias voltage requirements.…”
mentioning
confidence: 98%
“…Therefore, it is critical to understand the trends in coupling behavior and device performance dependency on design parameters, which were not addressed in previous studies [8][9][10][11] as they reported on specific material and design choices. In our current work, we report the dependence of coupling efficiency on WG design and the resulting impact on PD performance.…”
mentioning
confidence: 99%
“…In recent years also for lab-on-chip devices for biosensing a clear trend towards integrated optical devices is evident [2]. On-chip integrated detectors operating in the telecom window are mainly based on III-V or SiGe, and recent achievements are reported in references [3][4][5][6][7][8]. For lab-on-chip devices the nearinfrared (NIR) spectral region between ~750nm and 900nm represents an interesting alternative.…”
Section: Introductionmentioning
confidence: 99%