Characterization of CuZnO Diodes Prepared by Ultrasonic Spray Method

Chen, Lung-Chien; Hsieh, Cheng-An

doi:10.1007/s11666-015-0347-7

Cited by 5 publications

(2 citation statements)

References 48 publications

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“…A decrease in surface roughness is observed with dopant concentration, leading for example to enhanced optical reflectivity [380]. By optimizing the deposition conditions, CuZnO nanowires (NW) can be formed with varying bandgap and morphology of the thin films [381].…”

Section: Photovoltaicsmentioning

confidence: 99%

A deep look into the spray coating process in real-time—the crucial role of x-rays

Roth

2016

J. Phys.: Condens. Matter

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Tailoring functional thin films and coating by rapid solvent-based processes is the basis for the fabrication of large scale high-end applications in nanotechnology. Due to solvent loss of the solution or dispersion inherent in the installation of functional thin films and multilayers the spraying and drying processes are strongly governed by non-equilibrium kinetics, often passing through transient states, until the final structure is installed. Therefore, the challenge is to observe the structural build-up during these coating processes in a spatially and time-resolved manner on multiple time and length scales, from the nanostructure to macroscopic length scales. During installation, the interaction of solid-fluid interfaces and between the different layers, the flow and evaporation themselves determine the structure of the coating. Advanced x-ray scattering methods open a powerful pathway for observing the involved processes in situ, from the spray to the coating, and allow for gaining deep insight in the nanostructuring processes. This review first provides an overview over these rapidly evolving methods, with main focus on functional coatings, organic photovoltaics and organic electronics. Secondly the role and decisive advantage of x-rays is outlined. Thirdly, focusing on spray deposition as a rapidly emerging method, recent advances in investigations of spray deposition of functional materials and devices via advanced x-ray scattering methods are presented.

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Section: Photovoltaicsmentioning

confidence: 99%

A deep look into the spray coating process in real-time—the crucial role of x-rays

Roth

2016

J. Phys.: Condens. Matter

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“…Repins et al studied the co-evaporation technique for CZTSe film growth [10]. Films were also grown by spray deposition and pyrolysis [11,12]. In the present study, CZTSe films were prepared by a two-stage technique that involved reaction of sputtered/evaporated precursor stacks at elevated temperatures; and the impact of Cu content and the reaction temperature on the structural, optical, and electrical properties of the resulting compound layers was studied.…”

Section: Introductionmentioning

confidence: 96%

Influence of copper composition and reaction temperature on the properties of CZTSe thin films

Olğar

Atasoy

Başol

et al. 2016

Journal of Alloys and Compounds

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a b s t r a c tIn this study Cu 2 ZnSnSe 4 (CZTSe) compound layers were grown using a two-stage technique that involved deposition of metallic precursors (Cu, Zn, and Sn) and Se in the first stage, followed by reaction of all the species at temperatures between 525 C and 600 C, during the second stage of the process. Two sets of samples, one with Cu-poor, Zn-rich and the other with Cu-rich, Zn-rich compositions, were prepared and their structural, optical and electrical properties were measured. XRD analyses showed the characteristic peaks of CZTSe regardless of the Cu content and the processing temperature. However, for samples reacted at temperatures of 575 C and 600 C a Cu 2-x Se secondary phase separation was detected for all films suggesting that the reaction temperatures should be limited to values below 575 C in a twostage process such as ours. Excessive Sn loss was also present in samples processed at the highest temperatures. Raman scattering measurements confirmed formation of the CZTSe kesterite structure, and also indicated a small ZnSe phase, which could not be detected by XRD. Scanning electron micrographs demonstrated dense film structure with the Cu-rich films having smoother morphology. Optical characterization showed that increasing the Cu content in the compound layers caused a reduction in the optical band gap values due to increased interaction between the Cu-3d orbital electrons and the Se-4p orbital electrons. Electrical measurements showed that the carrier concentration increased with Cu content.

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Characterization of transparent p-type Cu:ZnS thin films grown by spray pyrolysis technique

Krishna

Mahesha

2020

Journal of Alloys and Compounds

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Characterization of CuZnO Diodes Prepared by Ultrasonic Spray Method

Cited by 5 publications

References 48 publications

A deep look into the spray coating process in real-time—the crucial role of x-rays

A deep look into the spray coating process in real-time—the crucial role of x-rays

Influence of copper composition and reaction temperature on the properties of CZTSe thin films

Characterization of transparent p-type Cu:ZnS thin films grown by spray pyrolysis technique

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