1983
DOI: 10.1109/t-ed.1983.21314
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Characterization of local transfer defects in CCD's using a multireversal transfer mode

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“…Since that time, charge-shuffling has been little utilised. Part of the reason may stem from experiments by Lemonier & Piaget (1983). By rapidly shifting charge backwards and forwards many times (pocket pumping), they were able to identify local defects in the potential profile (trapping sites) within the silicon substrate.…”
Section: Introductionmentioning
confidence: 99%
“…Since that time, charge-shuffling has been little utilised. Part of the reason may stem from experiments by Lemonier & Piaget (1983). By rapidly shifting charge backwards and forwards many times (pocket pumping), they were able to identify local defects in the potential profile (trapping sites) within the silicon substrate.…”
Section: Introductionmentioning
confidence: 99%