The mechanical and dielectric properties of two types of amorphous silicon nitride (Si3N4) fibers prior to and following annealing at 800 °C were studied. The tensile strengths of the Si3N4 fiber bundles were measured using unidirectional tensile experimentation at room temperature, whereas the permittivity values were measured at 8.2–12.4 GHz using the waveguide method. The results demonstrated that the tensile strength and dielectric properties of Si3N4 fibers were correlated to the corresponding composition, microstructure, and intrinsic performance of electrical resistance. The Si3N4 fibers with a lower content of amorphous SiNxOy presented an improved thermal stability, a higher tensile strength, a higher conductivity, and a significantly stable wave-transparent property. These were mainly attributed to the highly pure composition and decomposition of less amorphous SiNxOy.