This paper reports experimental studies of silver after 167 MeV Xe 26+ ions irradiation. Heavy ion implantation of samples with doses 2 × 10 12 , 5 × 10 12 , 10 13 , 5 × 10 13 and 10 14 was performed at IC-100 cyclotron at FLNR, JINR. Radiation damages were investigated with variable energy positron beam. Doppler broadening spectroscopy was applied and the line shape S parameter of annihilation line was extracted. The analysis of S parameter profiles gives information about the presence of open volume defects in irradiated samples. The positron diffusion length extracted from the profile decreases with the dose increase. It points out the increase of defects concentration. Probably, changes in the size or type of defects generated by various doses took place.