Characterization of soft errors caused by single event upsets in CMOS processes

Abstract

Abstract-Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in highperformance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present radiation particle interactions with silicon, charge collection effects, soft errors, and their effect on VLSI circuits. We also discuss the impact of SEUs on system reliability. We describe an accelerated measurement of SERs using a high-intensity neutron beam, the characterization of SERs in sequential logic cells, and technology scaling trends. Finally, some directions for future research are given.

Vulnerability Analysis and Risk Assessment for SoCs Used in Safety-Critical Embedded Systems

“…It is well known that the rate of soft errors caused by single event upset (SEU) increases rapidly while the chip fabrication enters the very deep submicron technology [Baumann, 2005;Constantinescu, 2002;Karnik et al, 2004;Zorian et al, 2005]. Radiation-induced soft errors could cause a serious dependability problem for SoCs, electronic control units, and nodes used in the safety-critical applications.…”

“…As system-on-chip (SoC) becomes more and more complicated, the SoC could encounter the reliability problem due to the increased likelihood of faults or radiation-induced soft errors especially when the chip fabrication enters the very deep submicron technology [Baumann, 2005;Constantinescu, 2002;Karnik et al, 2004;Zorian et al, 2005]. SoC becomes prevalent in the intelligent safetyrelated applications, and therefore, fault-robust design with the safety validation is required to guarantee that the developed SoC is able to comply with the safety requirements defined by the international norms, such as IEC 61508 [Brown, 2000;International Electrotechnical Commission [IEC], 1998-2000.…”

Dependability evaluation of COTS microprocessors via on-chip debugging facilities

“…En estos sistemas, el efecto de la radiación puede causar fallos de ejecución conocidos como soft-errors. Entre ellos, los Single-Event-Upsets (SEUs) o alteraciones de evento único [4]. Estos no producen un daño permanente, pero pueden causar un mal funcionamiento de un circuito o un fallo del sistema, que puede ser catastrófico.…”

Selective SWIFT-R

“…These are also known as soft errors. Specifically, we will focus on the type of transient faults known as Single Event Upset (SEU ), which is characterized by the logic state alteration of a single memory element in the system [2]. SEUs have usually been considered as a concern for space application systems, because it is in outer space where these are more frequent.…”