Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis

Analysis and Recommendations for Education Process of Experts in the Field of Scanning Probe Microscopy

“…Despite the fact that SPM is a technique of microscopy, the fact is that we can obtain a huge range of surface data [10][11][12][13][14][15][16][17][18]. In this regard, the methods of analyzing and interpreting the obtained results are of essential [19][20][21][22][23].…”

Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells

“…Advanced microscopy techniques are used for qualitative and quantitative description of optoelectronic and thin films 3-D surface micromorphology [5][6][7][8][9]. Using modern approaches to evaluation, the results can influence both the design of new structures and the increase in the performance of existing optoelectronic devices [10][11][12][13][14].…”

Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution

“…The 3D surface micromorphology of epilayers is a very important parameter because all other properties -optical, electrical, and mechanical -stem from these and this should be studied and controlled. The 3D surface micromorphology may be described in terms of its fractal geometry, which is a field of modern mathematics that uses non-integer dimensions to characterize the irregularity of a 3D complex surface geometry [19][20][21][22] . Furthermore, due to easy implementation, high precision and low computational time, the fractal analyses allow extracting different types of information from 3D complex surface characteristics, in contrast to traditional statistical parameters [23][24][25] .…”