2012
DOI: 10.1007/s11340-012-9628-y
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Characterization of the High Temperature Strain Partitioning in Duplex Steels

Abstract: International audienceA microgrid technique has been developed for the analysis of the high-temperature micro-scale strain distribution between ferrite and austenite into duplex stainless steels. The local strain is measured by micro-extensometry using square microgrids engraved on flat specimens by electro-lithography. The sample with microgrids on the surface and preliminary imaged with high definition scanning electron microscope (SEM), is inserted in a plane strain compression specimen to be deformed under… Show more

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Cited by 37 publications
(30 citation statements)
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“…4), therefore enabling the characterisation of local strain distributions in relation to the early stages of damage development in hot deformed austenite. Moreover, gold microgrids do not influence damage or microstructure evolution unlike etched microgrids used in previous studies [22][23][24]37]. The sharper definition of the microgrid gold lines as opposed to etched grooves also reduces the error in manually locating microgrid intersection points.…”
Section: Discussion Experimental Proceduresmentioning
confidence: 96%
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“…4), therefore enabling the characterisation of local strain distributions in relation to the early stages of damage development in hot deformed austenite. Moreover, gold microgrids do not influence damage or microstructure evolution unlike etched microgrids used in previous studies [22][23][24]37]. The sharper definition of the microgrid gold lines as opposed to etched grooves also reduces the error in manually locating microgrid intersection points.…”
Section: Discussion Experimental Proceduresmentioning
confidence: 96%
“…Although an optimal microgrid pitch of 20 μm was selected in this work due to the relatively coarse grain size of the investigated material, results obtained in this study demonstrate that a higher spatial resolution could be achieved at temperatures up to 1000°C by changing the scanning parameters during irradiation of the electro-sensitive resin in order to reduce the pitch size of gold microgrids. Gold is indeed commonly used for electron-beam lithography and, for instance, pitch sizes down to 40 nm have been reported in the literature [38] as opposed to a minimum pitch size of 5 μm achieved with etched microgrids in [22][23][24]37].…”
Section: Discussion Experimental Proceduresmentioning
confidence: 99%
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“…The CorrelManuV (CMV) DIC software [17][18][19][20][21][22] was used to correlate the grids from undeformed and deformed regions using a 30 9 30 pixel correlation subset and a 15 9 15 pixel search domain. Bilinear interpolation of grayscale was used to allow an accuracy of 0.1 pixel in displacement.…”
Section: Experimental Methodologymentioning
confidence: 99%