2013
DOI: 10.1016/j.jlumin.2013.03.046
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of the structural and optical properties of CuIn1−xGaxSe2 QJ;thin films by X-ray diffraction

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2014
2014
2020
2020

Publication Types

Select...
4

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 18 publications
0
2
0
Order By: Relevance
“…However, we notice that in other works [26], reported values are below 1.2 eV. In fact, the increase in direct band gap with change of gallium rate is studied by many investigators [27][28]. According to these researches, authors reported two main causes.…”
Section: Resultsmentioning
confidence: 82%
“…However, we notice that in other works [26], reported values are below 1.2 eV. In fact, the increase in direct band gap with change of gallium rate is studied by many investigators [27][28]. According to these researches, authors reported two main causes.…”
Section: Resultsmentioning
confidence: 82%
“…For the sample with multiquantum barriers, the XRD linewidths were observed to broaden, indicating crystalline randomization and interface roughness of the sample. To determine the size distribution of nanocrystallites in our samples, the XRD spectra were analyzed using the Warren-Averbach method in Fourier space [30,31], and the calculation results are shown in Figure 5. We can see that the sample with multiquantum barriers exhibits a wider breadth of nanocrystallite size distribution.…”
Section: Resultsmentioning
confidence: 99%