2016
DOI: 10.1016/j.tsf.2016.07.082
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Characterization of vanadium oxide thin films with different stoichiometry using Raman spectroscopy

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Cited by 84 publications
(57 citation statements)
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“…The lines at 425 and 494 cm −1 might also be associated with V 4 O 9 , whereas the remaining bands should correspond to the signal from V 3 O 7 . The spectra of our samples are remarkably similar to those reported earlier for V 7 O 16 (Figure d), V 6 O 13 (Figure e), and the product of degradation of some samples (Figures b and a) . Therefore, we believe that V 3 O 7 was produced in all the disputable cases.…”
Section: Resultssupporting
confidence: 89%
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“…The lines at 425 and 494 cm −1 might also be associated with V 4 O 9 , whereas the remaining bands should correspond to the signal from V 3 O 7 . The spectra of our samples are remarkably similar to those reported earlier for V 7 O 16 (Figure d), V 6 O 13 (Figure e), and the product of degradation of some samples (Figures b and a) . Therefore, we believe that V 3 O 7 was produced in all the disputable cases.…”
Section: Resultssupporting
confidence: 89%
“…Probably, this is a result of the nanometer size of the crystallites in the film. Compared with the magnetron‐sputtered films (Figure S4c), we see a very good agreement between the Raman spectra. The additional small feature at 430 cm −1 might be the missing E g mode, whereas a broad band around 808 cm −1 might be attributed to the presence of amorphous V 2 O 3 inclusions.…”
Section: Resultssupporting
confidence: 57%
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