1995
DOI: 10.1088/0268-1242/10/1/001
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of VLSI metal conductors using a first-order Joule heating model

Abstract: The electromigration accelerating factors are critically dependent on the absolute temperature of the conductor. This temperature is governed by the ambient background temperature and the temperature rise due to the elevated current. A first-order model of steady state Joule heating within small-geometry VLSI metallizations has been developed. By careful consideration of t h e first-order relationships between conductor resistance, current and temperature it Is possible to extract parameters in order to charac… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

1998
1998
2015
2015

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 8 publications
references
References 6 publications
0
0
0
Order By: Relevance