2013
DOI: 10.1117/12.2028759
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Characterization results of the TROPOMI Short Wave InfraRed detector

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Cited by 13 publications
(24 citation statements)
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“…The skewnormal width parameter is sensitive to the photosensitivity of the SWIR detector (Fig. 6 of Hoogeveen et al, 2013). These patterns are easily recognizable in the residual plot (Fig.…”
Section: Discussion Of Resultsmentioning
confidence: 88%
See 1 more Smart Citation
“…The skewnormal width parameter is sensitive to the photosensitivity of the SWIR detector (Fig. 6 of Hoogeveen et al, 2013). These patterns are easily recognizable in the residual plot (Fig.…”
Section: Discussion Of Resultsmentioning
confidence: 88%
“…A nonlinearity correction is not implemented in the operational processor. It is also not needed for the ISRF characterization, as the error is small: detector nonlinearity was measured to be about 0.1 to 0.2 % (Hoogeveen et al, 2013). In irradiance measurements, where the light is imaged as a vertical line, the ISRF at one row could be affected by stray light from other rows.…”
Section: Data Preparationmentioning
confidence: 99%
“…All other detector calibration results of the CMOS SWIR detector are reported in Hoogeveen et al (2013).…”
Section: Detector Calibrationmentioning
confidence: 99%
“…Here we treat the UVN electronic calibration, the SWIR calibration is described in Hoogeveen et al (2013). Table 6 gives a summary of the 15 UVN calibrated electronic and detector properties which are part of the CKD in the L01b data processor.…”
Section: Electronic Calibrationmentioning
confidence: 99%
“…The pattern is probably due to variations in the sensitive area of the detector as the pattern is also seen in sensitivity plots of the detector alone (Hoogeveen et al, 2013). The fine-scale structures are smoothed in the parameter fit.…”
mentioning
confidence: 99%