2016
DOI: 10.1103/physrevapplied.6.054018
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Charge-Separation Kinetics of Photoexcited Oxygen Vacancies in ZnO Nanowire Field-Effect Transistors

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Cited by 20 publications
(9 citation statements)
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“…47 Lu et al reported a positive correlation between the electric field and the charge-separation behavior of photoexcited electrons and ionized oxygen vacancies (V + O /V 2+ O ) in a ZnO field-effect transistor. 48 Analogously, in this work, a greater probability of a higher charge-separation and more photoexcited electrons in the ZTO channel was attained by applying a light-bias programming V G,prog. = −40 V process with light illumination.…”
Section: Resultssupporting
confidence: 51%
See 1 more Smart Citation
“…47 Lu et al reported a positive correlation between the electric field and the charge-separation behavior of photoexcited electrons and ionized oxygen vacancies (V + O /V 2+ O ) in a ZnO field-effect transistor. 48 Analogously, in this work, a greater probability of a higher charge-separation and more photoexcited electrons in the ZTO channel was attained by applying a light-bias programming V G,prog. = −40 V process with light illumination.…”
Section: Resultssupporting
confidence: 51%
“…These results show that the charge-separation probability of the photoexcited electrons and V 2+ O is increased during the light-bias application, resulting in more photoexcited carriers in the ZTO than that under the light illumination. 47,48 Moreover, V 2+ O in the ZTO are driven to accumulate at the interface between the ZTO and Au NP with the application of V G,prog. = −40 V. The Schottky barrier width, which depends on the density of V 2+ O at the interface and determined the tunneling current, plays a key role for the memory performance.…”
Section: Resultsmentioning
confidence: 99%
“…[4][5][6] The latter ZnO-based heterostructure is one of the few oxides where the quantum Hall effect (QHE) 4 and the fractional quantum Hall effect (FQHE) 6 have been detected. On the other hand, ZnO is an appealing wide-bandgap semiconductor for optoelectronics 7 with an energy gap of E G ¼ 3.36 eV and a large exciton binding energy ('60 meV). 8 Moreover, the optoelectronic properties of ZnO are highly sensitive to adsorbed species on its surface.…”
mentioning
confidence: 99%
“…34 Analogously, in this work, a greater probability of separation between the photoexcited electrons and ionized oxygen vacancies (V o 2+ /V o + ) in oxide semiconductors is reasoned as the external increases. 35 Accordingly, the overlapping of the voltage pulse and light pulse reinforces the gate bias-enhanced charge separation effect and contributes more photoexcited electrons in the channel, leading to the amplification of drain current when |Δt| gets close to 0 s.…”
Section: ■ Results and Discussionmentioning
confidence: 99%