2021
DOI: 10.1016/j.nima.2020.164920
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Charge transport features of CdTe-based X- and γ-ray detectors with Ti and TiOx Schottky contacts

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Cited by 16 publications
(8 citation statements)
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“…The width of the SCR (Equation ( 4)) was calculated at the concentration of uncompensated acceptors N = N a −N d = 5 × 10 10 cm −3 as it was estimated for CdTe single crystals produced by Acrorad [20][21][22][23][24][25][26]. The temperature dependences of the bandgap E g (T) = 1.608 -4.52 × 10 −4 × T (eV), holes mobility µ p = 4 × 10 5 × T −3/2 (cm 2 /V•s), and resistivity of CdTe were taken into account [15,16,20].…”
Section: Electrical Characteristics Ofmentioning
confidence: 99%
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“…The width of the SCR (Equation ( 4)) was calculated at the concentration of uncompensated acceptors N = N a −N d = 5 × 10 10 cm −3 as it was estimated for CdTe single crystals produced by Acrorad [20][21][22][23][24][25][26]. The temperature dependences of the bandgap E g (T) = 1.608 -4.52 × 10 −4 × T (eV), holes mobility µ p = 4 × 10 5 × T −3/2 (cm 2 /V•s), and resistivity of CdTe were taken into account [15,16,20].…”
Section: Electrical Characteristics Ofmentioning
confidence: 99%
“…Figure 9 presents a comparison of the calculation results using Equations ( 1)-( 4) (solid lines) and experimental data (symbols). It should be emphasized that the calculations were performed at the concentration of uncompensated acceptors N = N a -N d = 5 × 10 10 cm −3 as it corresponded to CdTe single crystals produced by Acrorad and the ionization energy of the generation-recombination center was accepted as E t = 0.67 eV [20][21][22][23][24][25][26]. The computed results exhibited that the lifetimes τ n0 of electrons and holes τ p0 were such critical parameters determining the reverse current values in the I-V characteristics.…”
Section: Electrical Characteristics Of In/cdte/au Diode Structures Fabricated By Laser Irradiationmentioning
confidence: 99%
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